Chemical imaging analysis of the micropatterns of proteins and cells using cluster ion beam-based time-of-flight secondary ion mass spectrometry and principal component analysis

Bulletin of the Korean Chemical Society

Volumn 34, Issue 3, 2013, Pages 815-819

  Shon, Hyun Kyong ^a   Son, Jin Gyeong ^a,b   Lee, Kyung Bok ^c   Kim, Jinmo ^a   Kim, Myung Soo ^d   Choi, Insung S ^b   Lee, Tae Geol ^a  

^a Korea Research Institute of Standards and Science   (South Korea)

^b Korea Advanced Institute of Science and Technology (KAIST)   (South Korea)

^c Korea Basic Science Institute (KBSI)   (South Korea)

^d Seoul National University   (South Korea)

Author keywords

Chemical imaging; PCA; Protein and cell micropatterns; ToF SIMS

Indexed keywords

CHEMICAL IMAGES; CHEMICAL IMAGING; MICROPATTERNS; MULTIVARIATE DATA ANALYSIS; PCA; SECONDARY IONS; TIME OF FLIGHT SECONDARY ION MASS SPECTROMETRY; TOF SIMS;

CELLS; CYTOLOGY; ION BEAMS; MULTIVARIANT ANALYSIS; POSITIVE IONS; PRINCIPAL COMPONENT ANALYSIS; PROTEINS; SECONDARY ION MASS SPECTROMETRY;

CHEMICAL ANALYSIS;

EID: 84875757583     PISSN: 02532964     EISSN: 12295949     Source Type: Journal    
DOI: 10.5012/bkcs.2013.34.3.815     Document Type: Article

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