Surface oxide effect on optical sensing and photoelectric conversion of α-In2Se3 hexagonal microplates

ACS Applied Materials and Interfaces

Volumn 5, Issue 6, 2013, Pages 2269-2277

  Ho, Ching Hwa ^a   Lin, Chien Hao ^a   Wang, Yi Ping ^a   Chen, Ying Cen ^a   Chen, Shin Hong ^a   Huang, Ying Sheng ^a  

^a NATIONAL TAIWAN UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Taiwan)

Author keywords

III VI compound; In2Se3; photodetector; photoelectric conversion; surface oxidation; surface photovoltage

Indexed keywords

CHEMICAL VAPOR TRANSPORT; III-VI COMPOUNDS; PHOTOELECTRIC CONVERSION; PHYSICAL AND CHEMICAL PROPERTIES; SURFACE IMPERFECTIONS; SURFACE OXIDATION LAYERS; SURFACE OXIDATIONS; SURFACE PHOTOVOLTAGES;

CHEMICAL PROPERTIES; INFRARED DEVICES; PHOTOCONDUCTIVITY; PHOTODETECTORS; PHOTOELECTRICITY; PHOTOELECTRONS; PHOTONS; SURFACE PROPERTIES; X RAY PHOTOELECTRON SPECTROSCOPY;

SURFACE DEFECTS;

INDIUM; INDIUM TRISELENIDE; SELENIUM;

ARTICLE; CHEMISTRY; ELECTROCHEMISTRY; OXIDATION REDUCTION REACTION; SURFACE PROPERTY; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION; X RAY PHOTOELECTRON SPECTROSCOPY;

ELECTROCHEMISTRY; INDIUM; MICROSCOPY, ELECTRON, TRANSMISSION; OXIDATION-REDUCTION; PHOTOELECTRON SPECTROSCOPY; SELENIUM; SURFACE PROPERTIES; X-RAY DIFFRACTION;

EID: 84875710383     PISSN: 19448244     EISSN: 19448252     Source Type: Journal    
DOI: 10.1021/am400128e     Document Type: Article

References (36)

1. Peng, H.; Schoen, D. T.; Meister, S.; Zhang, X. F.; Cui, Y. J. Am. Chem. Soc. 2007, 129, 34-35
2. Kwon, S. H.; Ahn, B. T.; Kim, S. K.; Yoon, K. H.; Song, J. Thin Solid Films 1998, 323, 265-269
3. Zhai, T.; Ma, Y.; Li, L.; Fang, X.; Liao, M.; Koide, Y.; Yao, J.; Bando, Y.; Golberg, D. J. Mater. Chem. 2012, 20, 6630-6637
4. Mitzi, B.; Copel, M.; Chey, S. J. Adv. Mater. 2005, 17, 1285-1289
5. Sreekumar, R.; Jayakrishnan, R.; Kartha, C. S.; Vijayakumar, K. P. J. Appl. Phys. 2006, 100, 033707
6. Lai, K.; Peng, H.; Kundhikanjana, W.; Schoen, D. T.; Xie, C.; Meister, S.; Cui, Y.; Kelly, M. A.; Shen, Z. X. Nano Lett. 2009, 9, 1265-1269
7. Lee, J. Y.; Sun, K.; Li, B.; Xie, Y. H.; Wei, X.; Russell, T. P. Appl. Phys. Lett. 2010, 97, 092114
8. Peng, H.; Xie, C.; Schoen, D. T.; Cui, Y. Nano Lett. 2008, 8, 1511-1516
9. Sreekmar, R.; Jayakrishnan, R.; Kartha, S. K.; Vijayakumar, K. P.; Khan, S. A.; Avasthi, D. K. J. Appl. Phys. 2008, 103, 023709
10. Li, Q. L.; Gao, L. J.; Wang, S. D.; Sun, X. H. Appl. Phys. Lett. 2011, 99, 243105
11. Zhai, T.; Fang, X.; Liao, M.; Xu, X.; Li, L.; Liu, B.; Koide, Y.; Ma, Y.; Yao, J.; Bando, Y.; Golberg, D. ACS Nano 2010, 4, 1596-1602
12. Whittingan, M. S. Prog. Solid State Chem. 1978, 12, 41-99
13. Merle, J. C.; Batiromo, R.; Borsella, E.; Piacentini, M.; Savoia, A. Solid State Commun. 1978, 28, 251-255
14. Hogg, J. H. C. Acta Crystallogr. 1971, B27, 1630-1634
15. Li, Y.; Gao, J.; Li, Q.; Peng, M.; Sun, X.; Li, Y.; Yuan, G.; Wen, W.; Meyyappan, M. J. Mater. Chem. 2011, 21, 6944-6947
16. Ishikawa, M.; Nakayama, T. Jpn. J. Appl. Phys. 1998, 37, L1122-L1124
17. Ishikawa, M.; Nakayama, T. Jpn. J. Appl. Phys. 1997, 36, L1576-L1579
18. Marsillac, S.; Combot-Marie, A. M.; Bernéde, J. C.; Conan, A. Thin Solid Films 1996, 288, 14-20
19. Ye, J.; Soeda, S.; Nakamura, Y.; Nittono, O. Jpn. J. Appl. Phys. 1998, 37, 4264-4271
20. Emziane, M.; Marsillac, S.; Bernéde, J. C. Mater. Chem. Phys. 2000, 62, 84-87
21. Jansinski, J.; Swider, W.; Washburn, J.; Liliental-Weber, Z.; Chaiken, A.; Nauka, K.; Gibson, G. A.; Yang, C. C. Appl. Phys. Lett. 2002, 81, 4356-4358
22. Robles, R.; Barreau, N.; Vega, A.; Marsillac, S.; Bernède, J. C.; Mokrani, A. Opt. Mater. 2005, 27, 647-653
23. Ho, C. H.; Wang, Y. P.; Chan, C. H.; Huang, Y. S.; Li, C. H. J. Appl. Phys. 2012, 108, 043518
24. Ho, C. H. J. Cryst. Growth 2010, 312, 2718-2723
25. Wang, Y. P.; Ho, C. H.; Huang, Y. S. J. Phys. D: Appl. Phys. 2010, 43, 415301
26. Ho, C. H.; Lee, H. W.; Cheng, Z. H. Rev. Sci. Instrum. 2004, 75, 1098-1102
27. Ho, C. H. Appl. Phys. Lett. 2010, 96, 061902
28. Hsin, C. L.; Lee, W. F.; Huang, C. T.; Huang, C. W.; Wu, W. W.; Chen, L. J. Nano Lett. 2011, 11, 4348-4351
29. Hsu, C. L.; Lu, Y. C. Nanoscale 2012, 4, 5710-5717
30. Faur, M.; Faur, M.; Jayne, D. T.; Goradia, M.; Goradia, C. Sur. Interface Anal. 1990, 15, 641-650
31. Cahen, D.; Ireland, P. J.; Kazmerski, L. L.; Thiel, F. A. J. Appl. Phys. 1985, 57, 4761-4771
32. Neison, A. J.; Gebhard, S.; Kazmerski, L. L.; Colavita, E.; Engelhardt, M.; Höchst, H. Appl. Phys. Lett. 1990, 57, 1428-1430
33. Ho, C. H.; Chan, C. H.; Tien, L. C.; Huang, Y. S. J. Phys. Chem. C 2011, 115, 25088-25096
34. Tahar, R. B. H.; Ban, T.; Ohya, Y.; Takahashi, Y. J. Appl. Phys. 1997, 82, 865-870
35. Aspnes, D. E. In Handbook on Semiconductors; Balkanski, M., Ed.; North Holland: Amsterdam, The Netherlands, 1980.
36. Ho, C. H. J. Mater. Chem. 2011, 21, 10518-10524