Electrostatic effects at organic semiconductor interfaces: A mechanism for "cold" exciton breakup

Journal of Physical Chemistry C

Volumn 117, Issue 11, 2013, Pages 5617-5625

  Yost, Shane R ^a   Van Voorhis, Troy ^a  

^a MASSACHUSETTS INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BAND ALIGNMENTS; CARRIER DISTRIBUTIONS; COULOMBIC ATTRACTIONS; ELECTRON HOLE PAIRS; ELECTROSTATIC EFFECT; EXCITON DISSOCIATION; ORGANIC PHOTOVOLTAIC DEVICES; SEMICONDUCTOR INTERFACES;

BINDING ENERGY; DIELECTRIC MATERIALS; DISSOCIATION; ELECTRIC FIELDS;

EXCITONS;

EID: 84875459731     PISSN: 19327447     EISSN: 19327455     Source Type: Journal    
DOI: 10.1021/jp3125186     Document Type: Article

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