Energy level alignment at organic/metal interfaces studied by UV photoemission: breakdown of traditional assumption of a common vacuum level at the interface

IEEE Transactions on Electron Devices

Volumn 44, Issue 8, 1997, Pages 1295-1301

  Ishii, Hisao ^a   Seki, Kazuhiko ^b  

^a INSTITUTE FOR MOLECULAR SCIENCE   (Japan)

^b NAGOYA UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE CARRIERS; ELECTROLUMINESCENCE; ELECTRON ENERGY LEVELS; ELECTRON TRANSPORT PROPERTIES; ELECTRONIC STRUCTURE; INTERFACES (MATERIALS); ORGANOMETALLICS; PHOTOELECTRON SPECTROSCOPY; SEMICONDUCTING ORGANIC COMPOUNDS; ULTRAVIOLET SPECTROSCOPY;

ORGANIC ELECTROLUMINESCENT DEVICES; ULTRAVIOLET PHOTOEMISSION SPECTROSCOPY (UPS);

LUMINESCENT DEVICES;

EID: 0031207743     PISSN: 00189383     EISSN: None     Source Type: Journal    
DOI: 10.1109/16.605471     Document Type: Article

References (20)

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