Three-dimensional orientation microscopy by serial sectioning and EBSD-based orientation mapping in a FIB-SEM

Electron Backscatter Diffraction in Materials Science

Volumn , Issue , 2009, Pages 109-122

  Zaefferer, Stefan ^a   Wright, Stuart I ^b  

^a MAX PLANCK INSTITUT FÜR EISENFORSCHUNG GMBH   (Germany)

^b EDAX TSL   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 84875382983     PISSN: None     EISSN: None     Source Type: Book    
DOI: 10.1007/978-0-387-88136-2_8     Document Type: Chapter

References (37)

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