Texture and microstructure imaging by the Moving Area Detector Method

Solid State Phenomena

Volumn 105, Issue , 2005, Pages 3-14

  Preusser, A ^a   Klein, H ^b   Bunge, H J ^a  

^a CLAUSTHAL UNIVERSITY OF TECHNOLOGY   (Germany)

^b UNIVERSITY OF GÖTTINGEN   (Germany)

Author keywords

Diffraction imaging technique; Moving area detector technique; Multipeak Textures; Nickel; Recrystallization; Shortwave synchrotron radiation; Six dimensional orientation location space

Indexed keywords

CRYSTAL ORIENTATION; MICROSTRUCTURE; NICKEL; POLYCRYSTALLINE MATERIALS; RECRYSTALLIZATION (METALLURGY); TEXTURES; X RAYS;

DIFFRACTION IMAGING TECHNIQUE; MOVING AREA DETECTOR TECHNIQUE; MULTIPEAK TEXTURES; SHORTWAVE SYNCHROTRON RADIATION; SIX-DIMENSIONAL ORIENTATION-LOCATION SPACE;

IMAGING TECHNIQUES;

EID: 19344363590     PISSN: 10120394     EISSN: None     Source Type: Book Series    
DOI: 10.4028/www.scientific.net/ssp.105.3     Document Type: Conference Paper

References (9)

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3. O. Kratky: Z. Kristallogr. 72 (1930) 529
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6. H.J. Bunge, H. Klein, L. Wcislak, U. Garbe, W. Weiss and J.R. Schneider: Textures and Microstructures 35 (2003) 253
7. H.J. Bunge, L. Wcislak, H. Klein, U, Garbe and J.R. Schneider: J. Appl. Cryst. 36 (2003) 1240
8. H.J. Bunge, P.R. Morris and C.U. Nauer-Gerhardt: Textures and Microstructures 11 (1989) 1
9. H.J. Bunge and H. Klein: Z. Metallkunde 87 (1996) 465