Single-electron shift-register circuit

Microelectronics Journal

Volumn 44, Issue 4, 2013, Pages 332-338

  Telles, Marilia De Oliveira ^a   Guimarães, Janaina Gonçalves ^a  

^a UNIVERSITY OF BRASILIA   (Brazil)

Author keywords

Logic gate; Room temperature; Shift register; Single electron tunneling; Stability

Indexed keywords

D FLIP-FLOPS; NAND GATE; NOISE MARGINS; ROOM TEMPERATURE; SINGLE ELECTRON; SINGLE ELECTRON TUNNELING; SINGLE-ELECTRON TUNNELING DEVICES; STABILITY ANALYSIS;

CONVERGENCE OF NUMERICAL METHODS; ELECTRON TUNNELING; FLIP FLOP CIRCUITS; LOGIC GATES;

SINGLE ELECTRON TRANSISTORS;

EID: 84875228634     PISSN: 00262692     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.mejo.2013.02.012     Document Type: Article

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