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Volumn 532, Issue , 2013, Pages 66-72

Process monitoring of texture-etched high-rate ZnO:Al front contacts for silicon thin-film solar cells

Author keywords

Light trapping; Optimization; Process monitoring; Solar cell; Sputter deposition; Texture; Thin film; ZnO:Al

Indexed keywords

DEPOSITION CONDITIONS; DEPOSITION PARAMETERS; INDUSTRIAL FABRICATION; LIGHT-TRAPPING; PRESSURE AND TEMPERATURE; SCATTERING MEASUREMENTS; SILICON THIN-FILM SOLAR CELLS; ZNO:AL;

EID: 84875224742     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2012.11.147     Document Type: Article
Times cited : (10)

References (17)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.