High-Resolution X-ray Diffraction

Thin Film Analysis by X-Ray Scattering

Volumn , Issue , 2006, Pages 297-341

  Birkholz, Mario ^a   Fewster, Paul F ^b  

^a IHP   (Germany)

^b MALVERN INSTRUMENTS LTD   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 84875166439     PISSN: None     EISSN: None     Source Type: Book    
DOI: 10.1002/3527607595.ch7     Document Type: Chapter

References (33)

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