메뉴 건너뛰기




Volumn 13, Issue 3, 2013, Pages 1192-1195

Surface-state engineering for interconnects on H-passivated Si(100)

Author keywords

DFT; electron transport; nanowires; Silicon interconnects

Indexed keywords

CONDUCTION PROPERTIES; DANGLING-BOND WIRES; DFT; ELECTRON TRANSPORT; ELECTRONIC GAP; LATERAL SIZES; NANO-CIRCUITS; SI(100) SURFACE;

EID: 84874993238     PISSN: 15306984     EISSN: 15306992     Source Type: Journal    
DOI: 10.1021/nl304611m     Document Type: Article
Times cited : (31)

References (37)
  • 7
    • 0032516155 scopus 로고    scopus 로고
    • Kane, B. E. Nature 1998, 393, 133
    • (1998) Nature , vol.393 , pp. 133
    • Kane, B.E.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.