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Volumn 113, Issue 6, 2013, Pages

Erratum: Insulation degradation behavior of multilayer ceramic capacitors clarified by Kelvin probe force microscopy under ultra-high vacuum (Journal of Applied Physics (2013) 113 (064103) DOI: 10.1063/1.4791714);Insulation degradation behavior of multilayer ceramic capacitors clarified by Kelvin probe force microscopy under ultra-high vacuum

Author keywords

[No Author keywords available]

Indexed keywords

ANODES; BIAS VOLTAGE; CATHODES; CERAMIC CAPACITORS; DIELECTRIC MATERIALS; ELECTRIC SPACE CHARGE; GRAIN BOUNDARIES; MULTILAYERS; OXYGEN VACANCIES; PROBES;

EID: 84874342477     PISSN: 00218979     EISSN: 10897550     Source Type: Journal    
DOI: 10.1063/5.0177174     Document Type: Erratum
Times cited : (25)

References (30)
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    • Vollman, M.1    Waser, R.2
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.