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Volumn 41, Issue 9, 2002, Pages 5668-5673

Effects of rare-earth oxides on the reliability of X7R dielectrics

Author keywords

Barium titanate; Ionic radius; Microstructure; MLCs; Rare earth oxide; X7R

Indexed keywords

BARIUM TITANATE; CERAMIC MATERIALS; DIELECTRIC MATERIALS; ELECTRODES; ELECTRONS; LEAKAGE CURRENTS; MICROSTRUCTURE; TRANSMISSION ELECTRON MICROSCOPY;

ELECTRON PROBE MICROANALYSIS (EPMA);

RARE EARTH COMPOUNDS;

EID: 0036757347 PISSN: 00214922 EISSN: None Source Type: Journal
DOI: 10.1143/jjap.41.5668 Document Type: Article

Times cited : (136)

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