Determination and correction of distortions and systematic errors in low-energy electron diffraction

Review of Scientific Instruments

Volumn 84, Issue 1, 2013, Pages

  Sojka, Falko ^a   Meissner, Matthias ^a   Zwick, Christian ^a   Forker, Roman ^a   Fritz, Torsten ^a  

^a FRIEDRICH SCHILLER UNIVERSITY JENA   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CHANNELTRON; CORRECTION OF DISTORTION; DIFFRACTION SPOTS; ENERGY ERROR; MICRO CHANNEL PLATE; PRIMARY ENERGIES; RECONSTRUCTED SURFACES; RELATIVE ACCURACY; SI (1 1 1); SPOT PROFILE ANALYSIS;

ALGORITHMS; KINETICS; LATTICE CONSTANTS; LOW ENERGY ELECTRON DIFFRACTION;

ELECTRONS;

EID: 84874086846     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4774110     Document Type: Article

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