A method to correct elliptical distortion of diffraction patterns in TEM

Microscopy and Microanalysis

Volumn 14, Issue SUPPL. 2, 2008, Pages 1126-1127

  Hou, V D H ^a   Li, D ^a  

^a MICRON TECHNOLOGY INC   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 49549088157     PISSN: 14319276     EISSN: 14358115     Source Type: Journal    
DOI: 10.1017/S1431927608081464     Document Type: Conference Paper

References (2)

1. G.C. Capitani, P. Oleynikov, S. Hovmöller, M. Mellin, Ultramicroscopy, 106 (2006) 66
2. V. D.-H. Hou, "A DigitalMicrograph Script to Characterize Elliptical Distortion of Electron Diffraction Patterns in TEM", paper submitted to this proceeding. (2007)