X-ray Microdiffraction Measurements with Charge Coupled Detectors Using Tapered Optical Fiber Coupling

Journal of the Korean Physical Society

Volumn 44, Issue 2, 2004, Pages 256-259

  Chung, Jin Seok ^a   Youn, Hwa Shik ^b   Joo, Hyung Don ^b  

^a Soongsil University   (South Korea)

^b Pohang University of Science and Technology (POSTECH)   (South Korea)

Author keywords

CCD; Distortion correction; X ray microdiffraction

Indexed keywords

EID: 1542381048     PISSN: 03744884     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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