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Volumn 106, Issue 2, 2006, Pages 66-74
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A practical method to detect and correct for lens distortion in the TEM
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Author keywords
Electron diffraction; HRTEM; Projector lens distortion
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Indexed keywords
COMPUTER GRAPHICS;
ELECTRIC DISTORTION;
ELECTRON DIFFRACTION;
IMAGING SYSTEMS;
ROTATION;
TRANSMISSION ELECTRON MICROSCOPY;
DATA SET;
HRTEM;
LATTICE PARAMETER;
PROJECTOR LENS DISTORTION;
OPTICAL INSTRUMENT LENSES;
ARTICLE;
CELL STRUCTURE;
DEVICE;
ELECTRON DIFFRACTION;
ELECTRON MICROSCOPE;
EXPERIMENTATION;
IMAGING SYSTEM;
METRIC SYSTEM;
MICROSCOPE;
OPTICAL RESOLUTION;
QUANTITATIVE ANALYSIS;
RECORDING;
TRANSMISSION ELECTRON MICROSCOPY;
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EID: 28844509495
PISSN: 03043991
EISSN: None
Source Type: Journal
DOI: 10.1016/j.ultramic.2005.06.003 Document Type: Article |
Times cited : (57)
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References (25)
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