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Nanoscale

Volumn 5, Issue 5, 2013, Pages 1781-1784

Bond nature of active metal ions in SiO2-based electrochemical metallization memory cells

(4) Cho, Deok Yong a Tappertzhofen, Stefan a Waser, Rainer a,b Valov, Ilia a,b

a RWTH AACHEN UNIVERSITY (Germany)

b FORSCHUNGSZENTRUM JÜLICH (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ACTIVE METALS; BONDING CHARACTERISTICS; CHEMICAL INTERACTIONS; ELECTROCHEMICAL METALLIZATION (ECM); ELECTROCHEMICAL SYSTEMS; IONIC SPECIES; MEMORY CELL; MICROSCOPIC MODELS; NANO SCALE; NONVOLATILE MEMORY DEVICES; ORBITAL HYBRIDIZATION; PARTIAL OXIDATIONS; PHYSICOCHEMICAL PROPERTY; RESISTIVE SWITCHING; SOFT X-RAY ABSORPTION SPECTROSCOPIES; STILL MISSING;

CHEMICAL BONDS; DATA STORAGE EQUIPMENT; METAL IONS; METALS; SWITCHING SYSTEMS;

METALLIZING;

EID: 84874069964 PISSN: 20403364 EISSN: 20403372 Source Type: Journal
DOI: 10.1039/c3nr34148h Document Type: Article

Times cited : (49)

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