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Volumn 126, Issue , 2013, Pages 10-18

Observation of synchronized atomic motions in the field ion microscope

Author keywords

Charged particle microscope; FIB; Field ion microscope; Gallium focused ion beam; Neon

Indexed keywords

ATOM MOBILITY; ATOMIC MOTION; EMISSION CHARACTERISTICS; EMISSION PATTERN; FIB; FIELD ION MICROSCOPE; NANOMACHINING; TIME-SCALES;

EID: 84873183036     PISSN: 03043991     EISSN: 18792723     Source Type: Journal    
DOI: 10.1016/j.ultramic.2012.11.005     Document Type: Article
Times cited : (16)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.