Tungsten nanotip fabrication by spatially controlled field-assisted reaction with nitrogen

Journal of Chemical Physics

Volumn 124, Issue 20, 2006, Pages

  Rezeq, Moh'd ^a,b   Pitters, Jason ^a   Wolkow, Robert ^a,b  

^a NATIONAL RESEARCH COUNCIL CANADA   (Canada)

^b UNIVERSITY OF ALBERTA   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

EVAPORATION; ION MICROSCOPES; NITROGEN; SCANNING TUNNELING MICROSCOPY; TUNGSTEN;

FIELD ION MICROSCOPE (FIM); IMAGING VOLTAGE; NANOTIPS;

NANOTECHNOLOGY;

EID: 34547236763     PISSN: 00219606     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2198536     Document Type: Article

References (15)

1. Ph. Avouris, I.-W. Lyo, and Y. Hasegawa, J. Vac. Sci. Technol. A 11, 1725 (1993).
2. H.-W. Fink, IBM J. Res. Dev. 30, 460 (1986).
3. V. T. Binh, Surf. Sci. 202, L539 (1988).
4. M. Tomitori, K. Sugata, G. Okuyama, and H. Kimata, Surf. Sci. 355, 21 (1996).
5. T. Y. Fu, L.-C. Cheng, C.-H. Nien, and T. Tsong, Phys. Rev. B 64, 113401 (2001).
6. V. T. Binh and N. García, Ultramicroscopy 42-44, 80 (1992).
7. K. Nagaoka, H. Fujii, K. Matsuda, M. Komaki, Y. Murata, C. Oshima, and T. Sakurai, Appl. Surf. Sci. 182, 12 (2001).
8. T. Tamura and T. Hamamura, Surf. Sci. 95, L293 (1980).
9. J. T. Yates, Jr., R. Klein, and T. E. Madey, Surf. Sci. 58, 469 (1976).
10. M. Serrano and G. R. Darling, Surf. Sci. 532-535, 206 (2003).
11. G. Ehrlich and F. G. Hudda, J. Chem. Phys. 36, 3233 (1962).
12. K. Ota and S. Usami, Surf. Sci. 278/288, 99 (1993).
13. E. W. Müller and T. T. Tsong, Field Ion Microscopy: Principles and Applications (American Elsevier, New York, 1969).
14. K. D. Rendulic and Z. Knor, Surf. Sci. 7, 205 (1967).
15. The atoms on the topmost atomic terrace of a pole are often displaced from their proper position due to the surface reconstruction in the presence of the high field. M. K. Miller, Atom Probe Tomography: Analysis at the Atomic Level (Kluwer Academic/Plenum, New York, 2000), p. 52.