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Volumn 602, Issue 12, 2008, Pages 2128-2134
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Field-assisted oxygen etching for sharp field-emission tip
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Author keywords
Field emission (FE); Field ion microscopy (FIM); Tungsten tips
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Indexed keywords
ETCHING;
FIELD EMISSION;
FIELD-ION MICROSCOPY (FIM);
TUNGSTEN TIPS;
OXYGEN;
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EID: 44949185339
PISSN: 00396028
EISSN: None
Source Type: Journal
DOI: 10.1016/j.susc.2008.04.034 Document Type: Article |
Times cited : (36)
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References (24)
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