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Volumn 28, Issue 6, 2010, Pages

Fabrication and initial characterization of ultrahigh aspect ratio vias in gold using the helium ion microscope

Author keywords

[No Author keywords available]

Indexed keywords

FABRICATION; FOCUSED ION BEAMS; GOLD DEPOSITS; HELIUM; IONS; MILLING (MACHINING);

EID: 78650142188     PISSN: 21662746     EISSN: 21662754     Source Type: Journal    
DOI: 10.1116/1.3517514     Document Type: Article
Times cited : (41)

References (15)
  • 4
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    • Light in tiny holes
    • DOI 10.1038/nature05350, PII NATURE05350
    • C. Genet and T. W. Ebbesen, Nature (London) NATUAS 0028-0836 445, 39 (2007). 10.1038/nature05350 (Pubitemid 46074988)
    • (2007) Nature , vol.445 , Issue.7123 , pp. 39-46
    • Genet, C.1    Ebbesen, T.W.2
  • 6
    • 34247276111 scopus 로고    scopus 로고
    • FIB damage of Cu and possible consequences for miniaturized mechanical tests
    • DOI 10.1016/j.msea.2007.01.046, PII S0921509307000597
    • D. Kiener, C. Motz, M. Rester, M. Jenko, and G. Dehm, Mater. Sci. Eng., A MSAPE3 0921-5093 459, 262 (2007). 10.1016/j.msea.2007.01.046 (Pubitemid 46613471)
    • (2007) Materials Science and Engineering A , vol.459 , Issue.1-2 , pp. 262-272
    • Kiener, D.1    Motz, C.2    Rester, M.3    Jenko, M.4    Dehm, G.5
  • 8
  • 11
    • 84905942350 scopus 로고    scopus 로고
    • IMAGEJ 1.43d
    • IMAGEJ 1.43d, http://rsb.info.nih.gov/ij
  • 13
    • 84905960693 scopus 로고    scopus 로고
    • See supplementary material at E-JVTBD9-28-144006 for a video showing the breakthrough of this 20 nm wide via.
    • See supplementary material at http://dx.doi.org/10.1116/1.3517514 E-JVTBD9-28-144006 for a video showing the breakthrough of this 20 nm wide via.
  • 15
    • 84905928986 scopus 로고    scopus 로고
    • SRIM-2008, 03
    • SRIM-2008, 03, http://www.srim.org/


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.