Mechanical properties of β-Si3N4 thin layers in basal plane under tension: A molecular dynamics study

Applied Physics Letters

Volumn 102, Issue 3, 2013, Pages

  Lu, Xuefeng ^a   Chen, Meng ^a   Fan, Lei ^a   Wang, Chao ^a   Wang, Hongjie ^a   Qiao, Guanjun ^a  

^a XI'AN JIAOTONG UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

BASAL PLANES; FAILURE MECHANISM; FRACTURE STRESS; LINEAR RESPONSE; MOLECULAR DYNAMICS SIMULATIONS; NONLINEAR STRESS-STRAIN RELATIONSHIP; SIDE LENGTH; THIN LAYERS; UNIAXIAL TENSIONS; YOUNG'S MODULUS;

ELASTICITY; FRACTURE; SILICON; STRESS-STRAIN CURVES; STRUCTURAL DESIGN;

MOLECULAR DYNAMICS;

EID: 84872966968     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4788692     Document Type: Article

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