A lifetime estimation technique for voltage source inverters

IEEE Transactions on Power Electronics

Volumn 28, Issue 8, 2013, Pages 4113-4119

  Huang, Hui ^a   Mawby, P A ^a  

^a UNIVERSITY OF WARWICK   (United Kingdom)

Author keywords

Insulated gate bipolar transistor (IGBT); inverter; lifetime estimation; modeling; power cycling; reliability; renewable energy

Indexed keywords

ACCELERATED TESTS; CONVERTER DESIGN; DIFFERENT DAMAGES; ESTIMATION RESULTS; INSULATED GATE BIPOLAR TRANSISTOR MODULES; INVERTER; LIFETIME DATA; LIFETIME ESTIMATION; POWER CYCLING; POWER DEVICES; REAL SYSTEMS; RENEWABLE ENERGIES; SCALE SYSTEM; SOLDER FATIGUE; STRESS LEVELS; STRESS-DEPENDENT; VOLTAGE SOURCE INVERTER;

INSULATED GATE BIPOLAR TRANSISTORS (IGBT); MODELS; RELIABILITY;

ESTIMATION;

EID: 84872876470     PISSN: 08858993     EISSN: None     Source Type: Journal    
DOI: 10.1109/TPEL.2012.2229472     Document Type: Article

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