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Volumn , Issue , 2011, Pages

Electro-thermal modelling of three phase inverter

Author keywords

IGBT; Modelling; Voltage source inverter

Indexed keywords

DEVICE MODELS; ELECTRO-THERMAL MODEL; FIXED FREQUENCY; HEATING CURVES; JUNCTION TEMPERATURES; LOOK UP TABLE; MISSION PROFILE; MODELLING; OPERATING CONDITION; PHYSICS-BASED; POWER APPLICATIONS; POWER CYCLING; RENEWABLE ENERGY SYSTEMS; SWITCHING POWER LOSS; THERMAL NETWORK; THREE-PHASE INVERTER; VOLTAGE SOURCE INVERTER;

EID: 80053481190     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (23)

References (10)
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    • Bryant, A.T.1    Mawby, P.A.2    Palmer, P.R.3
  • 3
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  • 5
    • 80053482342 scopus 로고
    • A dynamic electro-thermal model for the igbt
    • Mar./Apr.
    • A. R. Hefner, "A dynamic electro-thermal model for the igbt," IEEE Trans. Ind. Appl., vol. 30, no. 2, p. 394405, Mar./Apr. 1994.
    • (1994) IEEE Trans. Ind. Appl. , vol.30 , Issue.2 , pp. 394405
    • Hefner, A.R.1
  • 6
    • 0141787901 scopus 로고    scopus 로고
    • Circuit simulator models for the diode and igbt with full temperature dependent features
    • Sep.
    • P. R. Palmer, E. Santi, J. L. Hudgins, X. Kang, J. C. Joyce, and P. Y. Eng, "Circuit simulator models for the diode and igbt with full temperature dependent features," IEEE Trans. Power Electron., vol. 18, no. 5, pp. 1220-1229, Sep. 2003.
    • (2003) IEEE Trans. Power Electron. , vol.18 , Issue.5 , pp. 1220-1229
    • Palmer, P.R.1    Santi, E.2    Hudgins, J.L.3    Kang, X.4    Joyce, J.C.5    Eng, P.Y.6
  • 7
    • 0141643281 scopus 로고    scopus 로고
    • Characterization and modeling of high-voltage field-stop igbts
    • Jul./Aug
    • X. Kang, A. Caiafa, E. Santi, J. L. Hudgins, and P. R. Palmer, "Characterization and modeling of high-voltage field-stop igbts," IEEE Trans. Ind. Appl., vol. 39, no. 4, pp. 922-928, Jul./Aug 2003.
    • (2003) IEEE Trans. Ind. Appl. , vol.39 , Issue.4 , pp. 922-928
    • Kang, X.1    Caiafa, A.2    Santi, E.3    Hudgins, J.L.4    Palmer, P.R.5
  • 8
    • 33644910694 scopus 로고    scopus 로고
    • Two-step parameter extraction procedure with formal optimization for physics-based circuit simulator IGBT and p-i-n diode models
    • DOI 10.1109/TPEL.2005.869742
    • A. T. Bryant, X. Kang, E. Santi, P. R. Palmer, and J. L. Hudgins, "Two-step parameter extraction procedure with formal optimization for physics-based circuit simulator igbt and p-i-n diode models," IEEE transactions on power electronics, vol. 21, no. 2, pp. 295-309, Mar. 2006. (Pubitemid 43380078)
    • (2006) IEEE Transactions on Power Electronics , vol.21 , Issue.2 , pp. 295-309
    • Bryant, A.T.1    Kang, X.2    Santi, E.3    Palmer, P.R.4    Hudgins, J.L.5
  • 9
    • 0032083619 scopus 로고    scopus 로고
    • On the effect of power cycling stress on IGBT modules
    • PII S002627149800081X
    • P. Cova and F. Fantini, "On the effect of power cycling stress on igbt modules," Microelectronics Reliability, vol. 38, pp. 1347-1352, 1998. (Pubitemid 128634030)
    • (1998) Microelectronics Reliability , vol.38 , Issue.6-8 , pp. 1347-1352
    • Cova, P.1    Fantini, F.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.