Spatial modeling for refining and predicting surface potential mapping with enhanced resolution

Nanoscale

Volumn 5, Issue 3, 2013, Pages 921-926

  Zhang, Qiong ^a   Deng, Xinwei ^b   Qian, Peter Z G ^a   Wang, Xudong ^c  

^a University of Wisconsin   (United States)

^b VIRGINIA POLYTECHNIC INSTITUTE AND STATE UNIVERSITY   (United States)

^c University of Wisconsin Madison   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BIVARIATE; ENVIRONMENTAL LIMITATIONS; HIGH RESOLUTION; HIGH-PRECISION; NANOWIRE ASSEMBLIES; POTENTIAL VALUES; PREDICTIVE METHODS; REGRESSION MODEL; SCANNING KELVIN PROBE MICROSCOPY; SPATIAL MODELING; SPATIAL RESOLUTION; STATISTICAL APPROACH; STATISTICAL MODELS; SUBNANOMETER RESOLUTION; SURFACE POTENTIAL DISTRIBUTIONS;

CHARACTERIZATION; FORECASTING; IMAGE RESOLUTION; NANOWIRES; REGRESSION ANALYSIS; SCANNING PROBE MICROSCOPY; SURFACE PROPERTIES;

SURFACE POTENTIAL;

NANOMATERIAL;

ALGORITHM; ARTICLE; CHEMICAL MODEL; CHEMISTRY; COMPUTER SIMULATION; ELECTROMAGNETIC FIELD; IMAGE ENHANCEMENT; METHODOLOGY; SCANNING PROBE MICROSCOPY; SURFACE PROPERTY; ULTRASTRUCTURE;

ALGORITHMS; COMPUTER SIMULATION; ELECTROMAGNETIC FIELDS; IMAGE ENHANCEMENT; MICROSCOPY, SCANNING PROBE; MODELS, CHEMICAL; NANOSTRUCTURES; SURFACE PROPERTIES;

MLCS; MLOWN;

EID: 84872728507     PISSN: 20403364     EISSN: 20403372     Source Type: Journal    
DOI: 10.1039/c2nr33603k     Document Type: Article

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