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Journal of Vacuum Science and Technology B:Nanotechnology and Microelectronics

Volumn 31, Issue 1, 2013, Pages

Modeling of top and bottom contact structure organic field effect transistors

(3) Kumar, Brijesh a Kaushik, Brajesh Kumar a Negi, Yuvraj Singh a

a INDIAN INSTITUTE OF TECHNOLOGY ROORKEE (India)

Author keywords

[No Author keywords available]

Indexed keywords

CONTACT RESISTANCE; ORGANIC FIELD EFFECT TRANSISTORS; SEMICONDUCTING ORGANIC COMPOUNDS;

BOTTOM CONTACTS; CONTACT EFFECT; DEVICE RESISTANCE; ELECTRICAL CHARACTERISTIC; NUMERICAL DEVICE SIMULATION; PENTACENE FILM; RESEARCH PAPERS; SATURATION REGIME; SOURCE-DRAIN; STRUCTURAL DIFFERENCES; TOP-CONTACT DEVICES;

COMPUTER SIMULATION;

EID: 84872717559 PISSN: 21662746 EISSN: 21662754 Source Type: Journal
DOI: 10.1116/1.4773054 Document Type: Article

Times cited : (34)

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