Novel test detection to improve simulation efficiency-A commercial experiment

IEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers, ICCAD

Volumn , Issue , 2012, Pages 101-108

  Chen, Wen ^a   Sumikawa, Nik ^a   Wang, Li C ^a   Bhadra, Jayanta ^b   Feng, Xiushan ^b   Abadir, Magdy S ^b  

^a UNIVERSITY OF CALIFORNIA   (United States)

^b FREESCALE SEMICONDUCTOR INC   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

LOAD STORE UNIT; LOW POWER PROCESSORS; SIMULATION EFFICIENCY; SIMULATION ENVIRONMENT; SIMULATION TIME;

COMPUTER AIDED DESIGN;

EXPERIMENTS;

EID: 84872328406     PISSN: 10923152     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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