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Volumn 26, Issue 6, 2007, Pages 1126-1138

Microprocessor verification via feedback-adjusted Markov models

Author keywords

Architectural simulation; Directed random simulation; High performance simulation

Indexed keywords

ARCHITECTURAL SIMULATION; DIRECTED RANDOM SIMULATION; HIGH PERFORMANCE SIMULATION;

EID: 34247629721     PISSN: 02780070     EISSN: None     Source Type: Journal    
DOI: 10.1109/TCAD.2006.884494     Document Type: Article
Times cited : (53)

References (17)
  • 1
    • 1942436273 scopus 로고    scopus 로고
    • Genesys-pro: Innovations in test program generation for functional processor verification
    • Mar./Apr
    • A. Adir et al., "Genesys-pro: Innovations in test program generation for functional processor verification," IEEE Des. Test Comput., vol. 21, no. 2, pp. 84-93, Mar./Apr. 2004.
    • (2004) IEEE Des. Test Comput , vol.21 , Issue.2 , pp. 84-93
    • Adir, A.1
  • 3
    • 4444315783 scopus 로고    scopus 로고
    • Industrial experience with test generation languages for processor verification
    • Jun
    • M. Behm, J. Ludden, Y. Lichtenstein, M. Rimon, and M. Vinov, "Industrial experience with test generation languages for processor verification," in Proc. DAC, Jun. 2004, pp. 36-40.
    • (2004) Proc. DAC , pp. 36-40
    • Behm, M.1    Ludden, J.2    Lichtenstein, Y.3    Rimon, M.4    Vinov, M.5
  • 4
    • 0034840742 scopus 로고    scopus 로고
    • Validating the Intel Pentium 4 microprocessor
    • B. Bentley, "Validating the Intel Pentium 4 microprocessor," in Proc. DAC, 2001, pp. 224-228.
    • (2001) Proc. DAC , pp. 224-228
    • Bentley, B.1
  • 5
    • 0142206120 scopus 로고    scopus 로고
    • Validating the Intel Pentium 4 processor
    • B. Bentley and R. Gray, "Validating the Intel Pentium 4 processor," Intel Technol. J., vol. 5, no. 1, pp. 1-8, 2001.
    • (2001) Intel Technol. J , vol.5 , Issue.1 , pp. 1-8
    • Bentley, B.1    Gray, R.2
  • 7
    • 0042635846 scopus 로고    scopus 로고
    • Coverage directed test generation for functional verification using bayesian networks
    • Jun
    • S. Fine and A. Ziv, "Coverage directed test generation for functional verification using bayesian networks," in Proc. DAC, Jun. 2003, pp. 286-291.
    • (2003) Proc. DAC , pp. 286-291
    • Fine, S.1    Ziv, A.2
  • 9
    • 0034986777 scopus 로고    scopus 로고
    • Y. Hollander, M. Morley, and A. Noy, The e language: A fresh separation of concerns, in Proc. Technol. Object-Oriented Languages and Syst., Mar. 2001, TOOLS-38, pp. 41-50.
    • Y. Hollander, M. Morley, and A. Noy, "The e language: A fresh separation of concerns," in Proc. Technol. Object-Oriented Languages and Syst., Mar. 2001, vol. TOOLS-38, pp. 41-50.
  • 10
    • 0036294466 scopus 로고    scopus 로고
    • Functional verification of the POWER4 microprocessor and POWER4 multiprocessor systems
    • Jan
    • J. M. Ludden et al., "Functional verification of the POWER4 microprocessor and POWER4 multiprocessor systems," IBM J. Res. Develop., vol. 46, no. 1, pp. 53-76, Jan. 2002.
    • (2002) IBM J. Res. Develop , vol.46 , Issue.1 , pp. 53-76
    • Ludden, J.M.1
  • 12
    • 84949232934 scopus 로고    scopus 로고
    • X-gen: A random test-case generator for systems and socs
    • R. Emek et al., "X-gen: A random test-case generator for systems and socs," in Proc. Int. Workshop HLDVT, 2002, pp. 145-150.
    • (2002) Proc. Int. Workshop HLDVT , pp. 145-150
    • Emek, R.1
  • 13
    • 27944465320 scopus 로고    scopus 로고
    • System-level validation of the Intel Pentium M processor
    • May
    • I. Silas, I. Frumkin, E. Hazan, E. Mor, and G. Zobin, "System-level validation of the Intel Pentium M processor," Intel Technol. J., vol. 7, no. 2, pp. 38-43, May 2003.
    • (2003) Intel Technol. J , vol.7 , Issue.2 , pp. 38-43
    • Silas, I.1    Frumkin, I.2    Hazan, E.3    Mor, E.4    Zobin, G.5
  • 14
    • 24944436995 scopus 로고    scopus 로고
    • Opportunities and challenges in building silicon products in 65 nm and beyond
    • G. Spirakis, "Opportunities and challenges in building silicon products in 65 nm and beyond," in Proc. DATE, 2004, pp. 2-3.
    • (2004) Proc. DATE , pp. 2-3
    • Spirakis, G.1
  • 15
    • 0035178746 scopus 로고    scopus 로고
    • A functional validation technique: Biased-random simulation guided by observability-based coverage
    • S. Tasiran, F. Fallah, D. G. Chinnery, S. J. Weber, and K. Keutzer, "A functional validation technique: Biased-random simulation guided by observability-based coverage," in Proc. ICCD, 2001, pp. 82-88.
    • (2001) Proc. ICCD , pp. 82-88
    • Tasiran, S.1    Fallah, F.2    Chinnery, D.G.3    Weber, S.J.4    Keutzer, K.5
  • 16
    • 0031639694 scopus 로고    scopus 로고
    • Functional verification of a multiple-issue, out-of-order, superscalar Alpha processor: The DEC Alpha 21264 microprocessor
    • S. Taylor, M. Quinn, D. Brown, N. Dohm, S. Hildebrandt, J. Muggins, and C. Ramey, "Functional verification of a multiple-issue, out-of-order, superscalar Alpha processor: The DEC Alpha 21264 microprocessor," in Proc. DAC, 1998, pp. 638-644.
    • (1998) Proc. DAC , pp. 638-644
    • Taylor, S.1    Quinn, M.2    Brown, D.3    Dohm, N.4    Hildebrandt, S.5    Muggins, J.6    Ramey, C.7


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.