STABILITY of CIGS solar cells and component materials evaluated by a step-stress accelerated degradation test method

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 8472, Issue , 2012, Pages

  Pern, F J ^a   Noufi, R ^a  

^a NATIONAL RENEWABLE ENERGY LABORATORY   (United States)

Author keywords

Al doped ZnO window layer; AlNi contact grid; CIGS solar cell; Damp heat stability; Encapsulated test structure; Mo on SLG; Performance reliability; Step stress accelerated degradation test (SSADT)

Indexed keywords

ACCELERATED DEGRADATION TESTS; CIGS SOLAR CELLS; CONTACT GRID; DAMP HEAT STABILITY; PERFORMANCE RELIABILITY; TEST STRUCTURE; WINDOW LAYER;

ALUMINUM; ELECTRIC RESISTANCE; ELECTROCHEMICAL IMPEDANCE SPECTROSCOPY; MATERIALS TESTING; MOISTURE CONTROL; PHOTOELECTROCHEMICAL CELLS; PHOTOVOLTAIC CELLS; RELIABILITY; SEALANTS; SEMICONDUCTOR JUNCTIONS; SOLAR CELLS; ZINC OXIDE;

NANOSTRUCTURED MATERIALS;

EID: 84872121097     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.930541     Document Type: Conference Paper

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