SCOPUS 정보 검색 플랫폼

Conference Record of the IEEE Photovoltaic Specialists Conference

Volumn , Issue , 2009, Pages 002359-002363

Further investigation of the lifetime-limiting failure mechanisms of CIGSS-based minimodules under environmental stress

(6) Feist, Rebekah a Rozeveld, Steve a Kern, Brandon a D'Archangel, Jeff a Yeung, Simon a Bernius, Mark a

a DOW CHEMICAL COMPANY (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CDS LAYER; DEVICE LAYERS; DEVICE PERFORMANCE; ENVIRONMENTAL STRESS; FAILURE MECHANISM; FILL FACTOR; INITIAL STATE; KIRKENDALL; MINIMODULES; ROOM TEMPERATURE; SHELL SOLAR INDUSTRIES; TOF-SIMS ANALYSIS; WATER BATHS; WINDOW LAYER; ZNO;

CADMIUM COMPOUNDS; CADMIUM SULFIDE; DEFECTS; GALLIUM; MOISTURE; OXYGEN; SECONDARY ION MASS SPECTROMETRY; SODIUM; ZINC OXIDE;

QUALITY ASSURANCE;

EID: 77951559984 PISSN: 01608371 EISSN: None Source Type: Conference Proceeding
DOI: 10.1109/PVSC.2009.5411323 Document Type: Conference Paper

Times cited : (15)

References (14)

1
- 84879701012
- Stress-induced degradation modes in CIGS mini-modules
- rd IEEE PVSC, 2008.
- (2008) rd IEEE PVSC
- Kempe, M.D.¹

2
- 84879738172
- Properties of encapsulated CIGS devices in 85C/85% RH
- rd IEEE PVSC, 2008.
- (2008) rd IEEE PVSC
- Olsen, L.¹

3
- 84879704280
- Damp-heat induced degradation of transparent conducting oxides for thin-film solar devices
- rd IEEE PVSC, 2008.
- (2008) rd IEEE PVSC
- Pern, F.J.¹

4
- 77951567031
- Damp-heat effects on CIGSS and CdTe devices
- st IEEE PVSC, 2005.
- (2005) st IEEE PVSC
- Olsen, L.¹

5
- 27944492088
- Characterizing and controlling Cu/(In+Ga) ratio during CIS manufacturing
- th IEEE PVSC, 2000, pp. 466-469.
- (2000) th IEEE PVSC , pp. 466-469
- Ulfert Ruhle, J.¹ Wieting, R.²

6
- 84879724351
- Examination of lifetime-limiting failure mechanisms in CIGSS-based PV minimodules under environmental stress
- rd IEEE PVSC, 2008.
- (2008) rd IEEE PVSC
- Feist, R.¹

7
- 0036948445
- CIS manufacturing at the megawatt scale
- th IEEE PVSC, 2002, pp. 478-483.
- (2002) th IEEE PVSC , pp. 478-483
- Wieting, R.¹

8
- 27944499326
- CIS thin film manufacturing at shell solar: Practical techniques in volume manufacturing
- st IEEE PVSC, 2005, pp. 177-182.
- (2005) st IEEE PVSC , pp. 177-182
- Wieting, R.¹

9
- 77951604924
- NREL/SR-520-40242
- D. E. Tarrant et al, "CIS Modules Process R&D Final Technical Report: October 2005-June 2006", 2006, NREL/SR-520-40242.
- (2006) CIS Modules Process R&D Final Technical Report: October 2005-June 2006
- Tarrant, D.E.¹

10
- 1842680813
- Accelerated testing and failure of thin-film PV modules
- T. J. McMahon, "Accelerated testing and failure of thin-film PV modules." Progress in Photovoltaics: Research and Applications 12, 2004, pp. 235-248.
- (2004) Progress in Photovoltaics: Research and Applications , vol.12 , pp. 235-248
- McMahon, T.J.¹

11
- 0036467719
- 2 solar cells
- 2 solar cells." Thin Solid Films 403-404, 2002, pp. 325-330.
- (2002) Thin Solid Films , vol.403-404 , pp. 325-330
- Deibel, C.¹

12
- 56349155723
- Accelerated stress testing and diagnostic analysis of degradation in CdTe solar cells
- August 10-14
- D. Albin, "Accelerated stress testing and diagnostic analysis of degradation in CdTe solar cells." SPIE 2008 Reliability of Photovoltaic Cells, Modules, Components and Systems, August 10-14, 2008.
- (2008) SPIE 2008 Reliability of Photovoltaic Cells, Modules, Components and Systems
- Albin, D.¹

13
- 0033879065
- y/ZnO for superstrate solar cells
- DOI 10.1016/S0040-6090(99)00780-4
- F. Haug et al, "Characterization of CuGaxSey/ZnO for superstrate solar cells." Thin Solid Films 361-362, 2000, pp. 239-242. (Pubitemid 30552397)
- (2000) Thin Solid Films , vol.361 , pp. 239-242
- Haug, F.-J.¹ Krejci, M.² Zogg, H.³ Tiwari, A.N.⁴ Kirsch, M.⁵ Siebentritt, S.⁶

14
- 0036467930
- 2/ZnO superstrate solar cells and its impact on their photovoltaic properties
- 2/ZnO superstrate solar cells and its impact on their photovoltaic properties." Thin Solid Films 403-404, 2002, pp. 212-215.
- (2002) Thin Solid Films , vol.403-404 , pp. 212-215
- Terheggen, M.¹

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.