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Volumn , Issue , 2009, Pages 000287-000292

A study on the humidity susceptibility of thin-film CIGS absorber

Author keywords

[No Author keywords available]

Indexed keywords

ABSORBER FILMS; CELL EFFICIENCY; CIGS FILMS; CO-EVAPORATED; DAMP HEAT; DEVICE EFFICIENCY; ELECTRICAL AND ELECTRONIC PROPERTIES; HIGH SERIES RESISTANCES; RELATIVE HUMIDITIES; SHUNT RESISTANCES; SODA LIME GLASS;

EID: 77951543901     PISSN: 01608371     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/PVSC.2009.5411676     Document Type: Conference Paper
Times cited : (19)

References (26)
  • 3
    • 0033899684 scopus 로고    scopus 로고
    • Influence of damp heat on the electrical properties of Cu(ln,Ga)Se2 solar cells
    • M. Schmidt, D. Braunger, R. Schaffler, H. W. Schock, and U. Rau, "Influence of damp heat on the electrical properties of Cu(ln,Ga)Se2 solar cells," Thin Solid Films, 361-362, 2000, pp. 283-287.
    • (2000) Thin Solid Films , vol.361-362 , pp. 283-287
    • Schmidt, M.1    Braunger, D.2    Schaffler, R.3    Schock, H.W.4    Rau, U.5
  • 6
    • 0037370406 scopus 로고    scopus 로고
    • 2 Solar Mini-Module I-V Characteristics under Continuous and Light/Dark Irradiation Cycle Tests
    • 2 Solar Mini-Module I-V Characteristics under Continuous and Light/Dark Irradiation Cycle Tests," Microelectronics Reliability, 43, 2003, pp. 503-507.
    • (2003) Microelectronics Reliability , vol.43 , pp. 503-507
    • Yanagisawa, T.1    Kojima, T.2
  • 20
    • 0038819645 scopus 로고    scopus 로고
    • Measurement of Built-in Electrical Potential in III-V Solar Cells by Scanning Kelvin Probe Microscopy
    • C.-S. Jiang, H. R. Moutinho, D. J. Friedman, J. F. Geisz, and M. M. AI-Jassim, "Measurement of Built-in Electrical Potential in III-V Solar Cells by Scanning Kelvin Probe Microscopy," J. Appl. Phys., 93, 2003, pp. 10035-10040.
    • (2003) J. Appl. Phys. , vol.93 , pp. 10035-10040
    • Jiang, C.-S.1    Moutinho, H.R.2    Friedman, D.J.3    Geisz, J.F.4    Ai-Jassim, M.M.5
  • 25
    • 0000801450 scopus 로고
    • MOS Conductance Technique for Measuring Surface State Parameters
    • E. H. Nicollian and A. Goetzberger, "MOS Conductance Technique for Measuring Surface State Parameters," Appl. Phys. Lett., 7, 1965, pp. 216-219.
    • (1965) Appl. Phys. Lett. , vol.7 , pp. 216-219
    • Nicollian, E.H.1    Goetzberger, A.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.