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1
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52449118906
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Materials testing for PV module encapsulation
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Denver, CO, March
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G. Jorgensen, K. Terwilliger, S. Glick, J. Pern, and T. McMahon, "Materials Testing for PV Module Encapsulation," Proc. DOE SETP Program Review Meeting, Denver, CO, March 24-26, 2003.
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(2003)
Proc. DOE SETP Program Review Meeting
, pp. 24-26
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Jorgensen, G.1
Terwilliger, K.2
Glick, S.3
Pern, J.4
McMahon, T.5
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2
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33745525302
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Moisture transport, adhesion, and corrosion protection of PV module packaging materials
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G. J. Jorgensen, K. M. Terwilliger, J. A. DelCueto, S. H. Glick, M. D. Kempe, J. W. Pankow, F. J. Pern, T. J. McMahon, "Moisture Transport, Adhesion, and Corrosion Protection of PV Module Packaging Materials," Solar Energy Materials & Solar Cells, 90, (2006) 2739-2775.
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(2006)
Solar Energy Materials & Solar Cells
, vol.90
, pp. 2739-2775
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Jorgensen, G.J.1
Terwilliger, K.M.2
Delcueto, J.A.3
Glick, S.H.4
Kempe, M.D.5
Pankow, J.W.6
Pern, F.J.7
McMahon, T.J.8
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3
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56249085597
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Long-term performance data and analysis of CIS/CIGS modules deployed outdoors
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Aug. 10-11, San Diego, CA
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J. A. del Cueto, S. Rummel, B. Kroposki, A. Anderberg, "Long-Term Performance Data and Analysis of CIS/CIGS Modules Deployed Outdoors," Proc. SPIE PV Conference (#7045) on Photovoltaic Cell and Module Technologies II, Aug. 10-11, 2008, San Diego, CA.
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(2008)
Proc. SPIE PV Conference (#7045) on Photovoltaic Cell and Module Technologies II
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Del Cueto, J.A.1
Rummel, S.2
Kroposki, B.3
Anderberg, A.4
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4
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84879724351
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Examination of lifetime-limiting failure mechanisms in CIGSS-based PV minimodules under environmental stress
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San Diego, CA, May 11-16
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R. Feist, S. Rozeveld, M. Mushrush, R. Kaley, B. Lemon, J. Gerbi, B. Nichols, R. Nilsson, T. Richardson, S. Sprague, R. Tesch, S. Torka, C. Wood, S. Wu, S. Yeung, and M. T. Bernius, "Examination of Lifetime-Limiting Failure Mechanisms in CIGSS-based PV Minimodules under Environmental Stress," Proc. 33rd IEEE PVSC, San Diego, CA, May 11-16, 2008.
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(2008)
Proc. 33rd IEEE PVSC
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Feist, R.1
Rozeveld, S.2
Mushrush, M.3
Kaley, R.4
Lemon, B.5
Gerbi, J.6
Nichols, B.7
Nilsson, R.8
Richardson, T.9
Sprague, S.10
Tesch, R.11
Torka, S.12
Wood, C.13
Wu, S.14
Yeung, S.15
Bernius, M.T.16
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5
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77951559984
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Further investigation of the lifetime-limiting failure mechanisms of CIGSS-based minimodules under environmental stress
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Philadelphia, PA, June 7-12
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R. Feist, S. Rozeveld, B. Kern, J. D'Archangel, S. Yeung, and M. Bernius, "Further Investigation of The Lifetime-Limiting Failure Mechanisms of CIGSS-Based Minimodules under Environmental Stress," Proc. 34th IEEE PVSC, Philadelphia, PA, June 7-12, 2009.
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(2009)
Proc. 34th IEEE PVSC
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Feist, R.1
Rozeveld, S.2
Kern, B.3
D'archangel, J.4
Yeung, S.5
Bernius, M.6
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6
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84879701012
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Stress induced degradation modes in CIGS mini-modules
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San Diego, CA, May 11-16
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M. D. Kempe, K Terwilliger, and D. Tarrant, "Stress Induced Degradation Modes in CIGS Mini-Modules," Proc. 33th IEEE PVSC, San Diego, CA, May 11-16, 2008.
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(2008)
Proc. 33th IEEE PVSC
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Kempe, M.D.1
Terwilliger, K.2
Tarrant, D.3
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7
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56249124086
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An investigation of stability issues of ZnO and Mo on glass substrates for CIGS solar cells upon accelerated weathering and damp heat exposures
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Denver, CO., April 17-19
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F. J. Pern and R. Noufi, " An Investigation of Stability Issues of ZnO and Mo on Glass Substrates for CIGS Solar Cells upon Accelerated Weathering and Damp Heat Exposures," Proc. DOE SETP Review Meeting, Denver, CO., April 17-19, 2007.
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(2007)
Proc. DOE SETP Review Meeting
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Pern, F.J.1
Noufi, R.2
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8
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84879704280
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Damp-heat induced degradation of transparent conducting oxides for thin-film solar cells
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San Diego, CA, May 11-16
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F. J. Pern, R. Noufi, X. Li, C. DeHart, and B. To, "Damp-Heat Induced Degradation of Transparent Conducting Oxides for Thin-Film Solar Cells," Proc. 33rd IEEE PVSC, San Diego, CA, May 11-16, 2008.
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(2008)
Proc. 33rd IEEE PVSC
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Pern, F.J.1
Noufi, R.2
Li, X.3
Dehart, C.4
To, B.5
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9
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56249097234
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Degradation of ZnO-based window layers for thin-film CIGS by accelerated stress exposures
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Aug. 11-13, San Diego, CA
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F. J. Pern, R. Noufi, B. To, C. DeHart, X. Li, and S. H. Glick, "Degradation of ZnO-based Window Layers for Thin-Film CIGS by Accelerated Stress Exposures," Proc. SPIE Conference (#7048) on Reliability of Photovoltaic Cells, Modules, Components, and Systems, Aug. 11-13, 2008, San Diego, CA.
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(2008)
Proc. SPIE Conference (#7048) on Reliability of Photovoltaic Cells, Modules, Components, and Systems
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Pern, F.J.1
Noufi, R.2
To, B.3
Dehart, C.4
Li, X.5
Glick, S.H.6
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10
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77951543901
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A study on the humidity susceptibility of thin-film CIGS absorber
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Philadelphia, PA, June 7-12
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F. J. Pern, B. Egaas, B. To, C.-S. Jiang, Jian V. Li, S. Glynn, and C. DeHart, "A Study on the Humidity Susceptibility of Thin-Film CIGS Absorber," Proc. 34th IEEE PVSC, Philadelphia, PA, June 7-12, 2009.
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(2009)
Proc. 34th IEEE PVSC
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Pern, F.J.1
Egaas, B.2
To, B.3
Jiang, C.-S.4
Li, J.V.5
Glynn, S.6
Dehart, C.7
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11
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77951585911
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Comparison of amorphous InZnO and polycrystalline ZnO:Al conductive layers for CIGS solar cells
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Philadelphia, PA, June 7-12
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R. Sundaramoorthy, I. L. Repins, T. Gennett, F. J. Pern, D. Albin, Jian V. Li, C. DeHart, S. Glynn, J. D. Perkins, D. S. Ginley, and T. Gessert, "Comparison of Amorphous InZnO and Polycrystalline ZnO:Al Conductive Layers for CIGS Solar Cells," Proc. 34th IEEE PVSC, Philadelphia, PA, June 7-12, 2009.
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(2009)
Proc. 34th IEEE PVSC
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Sundaramoorthy, R.1
Repins, I.L.2
Gennett, T.3
Pern, F.J.4
Albin, D.5
Li, J.V.6
Dehart, C.7
Glynn, S.8
Perkins, J.D.9
Ginley, D.S.10
Gessert, T.11
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13
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56249085024
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Damp heat effects on CIGSS and CdTe cells
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Denver, CO., April 17-19
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L. Olson, S. Kundu, M. Gross, and A. Joly, "Damp Heat Effects on CIGSS and CdTe Cells," Proc. DOE SETP Review Meeting, Denver, CO., April 17-19, 2007.
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(2007)
Proc. DOE SETP Review Meeting
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Olson, L.1
Kundu, S.2
Gross, M.3
Joly, A.4
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14
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84879738172
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Properties of encapsulated CIGS cells in 85°C/85%RH
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San Diego, CA, May 11-16
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L. Olson, M. E. Gross, and S. Kundu, "Properties of Encapsulated CIGS Cells in 85°C/85%RH," Proc. 33rd IEEE PVSC, San Diego, CA, May 11-16, 2008.
-
(2008)
Proc. 33rd IEEE PVSC
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Olson, L.1
Gross, M.E.2
Kundu, S.3
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