Metrology challenges for high-rate nanomanufacturing of polymer structures

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 8466, Issue , 2012, Pages

  Mead, Joey ^a   Barry, Carol ^a   Busnaina, Ahmed ^b   Isaacs, Jacqueline ^b  

^a University of Massachusetts   (United States)

^b NORTHEASTERN UNIVERSITY   (United States)

Author keywords

Coextrusion; Directed assembly; Nanomanufacturing; Polymer blends; Polymers nanocomposites

Indexed keywords

ASSEMBLY PROCESS; CHEMICAL FUNCTIONALIZATION; COMMERCIAL PRODUCTS; DIRECTED ASSEMBLY; ELECTRONIC MATERIALS; EMI SHIELDING; HIGH RATE; IN-LINE METROLOGY; MANUFACTURING PROCESS; NANO-MANUFACTURING; NANOELEMENTS; NANOSCALE MANUFACTURING; PLASTICS FABRICATION; POLYMER BASED; POLYMER STRUCTURE; POLYMER SUBSTRATE; REEL TO REEL;

AUTOMOBILE MANUFACTURE; CARBON NANOTUBES; COEXTRUSION; CONDUCTING POLYMERS; ELECTRIC FIELDS; INSTRUMENTS; POLYMER BLENDS; UNITS OF MEASUREMENT;

MEASUREMENTS;

EID: 84872111199     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.953414     Document Type: Conference Paper

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