A dielectric omnidirectional reflector

Science

Volumn 282, Issue 5394, 1998, Pages 1679-1682

  Fink, Yoel ^a   Winn, Joshua N ^b   Fan, Shanhui ^b   Chen, Chiping ^c   Michel, Jurgen ^a   Joannopoulos, John D ^b   Thomas, Edwin L ^a  

^a USA   (United States)

^b MASSACHUSETTS INSTITUTE OF TECHNOLOGY   (United States)

^c MASSACHUSETTS INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DIELECTRIC FILMS; FABRICATION; GEOMETRICAL OPTICS; NATURAL FREQUENCIES; POLYSTYRENES; REFLECTION; TELLURIUM; THERMOELECTRIC EQUIPMENT;

OMNIDIRECTIONAL REFLECTORS; OPTICAL CAVITY;

MIRRORS;

ARTICLE; ELECTRIC CONDUCTIVITY; FREQUENCY ANALYZER; GEOMETRY; LIGHT; MATHEMATICAL COMPUTING; PRIORITY JOURNAL; REFLECTOMETRY; SPECTRAL SENSITIVITY;

EID: 0032573382     PISSN: 00368075     EISSN: None     Source Type: Journal    
DOI: 10.1126/science.282.5394.1679     Document Type: Article

References (13)

1. E. Yablonovitch, Phys. Rev. Lett. 58, 2059 (1987).
2. S. John, ibid., p. 2486.
3. J. D. Joannopoulos, R. Meade, J. N. Winn, Photonic Crystals: Molding the Flow of Light (Princeton Univ. Press, Princeton, NJ, 1995).
4. J. N. Winn et al., Opt. Lett., 23, 1573 (1998).
5. F. Abeles, Ann. Phys. 5, 706 (1950).
6. M. Born and E. Wolf, Principles of Optics (Pergamon, ed. 6, 1980), p. 67.
7. P. Yeh et al., J. Opt. Soc. Am. 67, 423 (1977).
8. 0 ω/c. Figure 2A is an example of a structure that does not have an omnidirectional reflectivity range even though its Brewster crossing is inaccessible to light coming from the homogeneous medium (the Brewster crossing lies outside the light cone). This is due to the large group velocity of modes in the lower band edge of the TM mode that allow every frequency to couple to a propagating state in the crystal. This should be contrasted with Fig. 2B, which exhibits an omnidirectional reflectivity range (highlighted in dark gray); the high indices of refraction actually allow for the opening of an additional omnidirectional reflectivity range in the higher harmonic as well.
9. C. J. Pouchert, The Aldrich Library of FT-IR Spectra, vol. II (Aldrich Chemical, Milwaukee, WI, 1985), p. 1204B.
10. -6 torr and 7A (Ladd Industries 30000) onto a NaCl 25-mm salt substrate (polished NaCl window; Wilmad Glass). The layer thickness and deposition rate were monitored in situ with a crystal thickness monitor (Sycon STM100). A 10% solution of polystyrene (GoodYear PS standard, 110,000 g/mol) in toluene was spin cast at 1000 rpm onto the tellurium-coated substrate and allowed to dry for a few hours; the polymer layer thickness is 1.65 ± 0.09 μm.
11. The nine-layer film sequence was Te/PS/Te/PS/Te/ PS/Te/PS/Te.
12. The calculations were done with the transfer matrix method described in (5) with the film parameters.
13. We thank J. F. Hester and A. Urbas for their valuable assistance and M. G. Bawendi and G. B. Kenney for stimulating discussions and inspiration. Supported in part by Defense Advanced Research Agency through U.S. Army Research Office under grant DAAG55-97-1-0366 and by the Air Force Office of Scientific Research under grants F49620-97-1-0325 and F49620-97-1-0385.