Error analysis for CGH optical testing

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3782, Issue , 1999, Pages 358-366

  Chang, Yu Chun ^a   Burge, James ^a  

^a HEWLETT PACKARD COMPANY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER GENERATED HOLOGRAPHY; COMPUTER SIMULATION; DIFFRACTION; ELECTRON BEAMS; ERROR ANALYSIS; HOLOGRAMS; INTERFEROMETRY; WAVEFRONTS;

PHASE FUNCTIONS; SCALAR DIFFRACTION MODEL;

OPTICAL TESTING;

EID: 0033315573     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (6)