Ab initio simulation of helium-ion microscopy images: The case of suspended graphene

Physical Review Letters

Volumn 109, Issue 26, 2012, Pages

  Zhang, Hong ^a   Miyamoto, Yoshiyuki ^b   Rubio, Angel ^c  

^a SICHUAN UNIVERSITY   (China)

^b Technology Research Association for Single Wall Carbon Nanotubes TASC   (Japan)

^c UNIVERSITY OF THE BASQUE COUNTRY UPV EHU   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

AB INITIO SIMULATIONS; AUGER PROCESS; EMISSION OF ELECTRON; HELIUM ION; HONEYCOMB PATTERN; IMPACT POINT; MICROSCOPY IMAGES; NANO-SCALE OBJECTS; NONDESTRUCTIVE IMAGING; TIME DEPENDENT DENSITY FUNCTIONAL THEORY;

DENSITY FUNCTIONAL THEORY; HELIUM; IMPACT IONIZATION; ION MICROSCOPES; KINETICS; SCANNING ELECTRON MICROSCOPY;

GRAPHENE;

EID: 84871799367     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.109.265505     Document Type: Article

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