Comparative study of target atomic number dependence of ion induced and electron induced secondary electron emission

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 206, Issue , 2003, Pages 52-56

  Ohya, K ^a  

^a UNIVERSITY OF TOKUSHIMA   (Japan)

Author keywords

Heavy ion; Ion induced kinetic electron emission; Monte Carlo simulation; Secondary electron emission; Target atomic number

Indexed keywords

COMPUTER SIMULATION; ELECTRONS; ENERGY TRANSFER; HEAVY IONS; ION BEAMS; MONTE CARLO METHODS;

SECONDARY ELECTRON EMISSIONS;

SECONDARY EMISSION;

EID: 0038485592     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-583X(03)00716-X     Document Type: Conference Paper

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