Nanoscale specific heat capacity measurements using optoelectronic bilayer microcantilevers

Applied Physics Letters

Volumn 101, Issue 24, 2012, Pages

  Burke, Brian G ^a   Lavan, David A ^a   Gates, Richard S ^a   Osborn, William A ^a  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM NANOPARTICLES; BI-LAYER; HIGH TEMPERATURE; MASS SENSOR; MICRO-CANTILEVERS; NANO SCALE;

ALUMINUM; ALUMINUM COATINGS; COMPOSITE MICROMECHANICS; NANOTECHNOLOGY; PLATINUM; SILICON NITRIDE;

SPECIFIC HEAT;

EID: 84871329227     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4772477     Document Type: Article

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