Discrete periodic melting point observations for nanostructure ensembles

Physical Review Letters

Volumn 85, Issue 17, 2000, Pages 3560-3563

  Efremov, M Yu ^a   Schiettekatte, F ^a   Zhang, M ^a   Olson, E A ^a   Kwan, A T ^a   Berry, R S ^b   Allen, L H ^a  

^a University of Illinois at Urbana Champaign   (United States)

^b UNIVERSITY OF CHICAGO   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DIFFERENTIAL SCANNING CALORIMETRY; HEATING; INDIUM; SILICON NITRIDE; TEMPERATURE; THERMODYNAMIC PROPERTIES; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION ANALYSIS;

HEAT OF MELTING; NANOCALORIMETRY; SIZE DEPENDENT MELTING POINT DEPRESSION;

NANOSTRUCTURED MATERIALS;

EID: 0034295958     PISSN: 00319007     EISSN: None     Source Type: Journal    
DOI: 10.1103/PhysRevLett.85.3560     Document Type: Article

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