Characterization of a 10-MHz quadrant APD for measuring frequency oscillations and tip displacements of microcantilevers

Applied Physics B: Lasers and Optics

Volumn 109, Issue 1, 2012, Pages 127-132

  Burke, Brian G ^a   LaVan, David A ^a  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DETECTABLE SIGNAL; HIGH FREQUENCY OSCILLATIONS; LASER SIGNALS; MEASURING FREQUENCY; MICRO-CANTILEVERS; OPTICAL MEASUREMENT; OPTOMECHANICAL; POWER LEVELS; QUADRANT DETECTORS; REFLECTED LASER; ROOM TEMPERATURE; SIGNAL TO NOISE; TIP DISPLACEMENT;

COMPOSITE MICROMECHANICS; FREQUENCY RESPONSE; LASERS; MECHANICAL VARIABLES MEASUREMENT; OPTICAL DATA PROCESSING; SIGNAL TO NOISE RATIO;

MOTION ESTIMATION;

EID: 84868600000     PISSN: 09462171     EISSN: None     Source Type: Journal    
DOI: 10.1007/s00340-012-5162-y     Document Type: Article

References (19)

1. M. Pierce, J. Stuart, A. Pungor, P. Dryden, V. Hlady, Langmuir 10, 3217 (1994)
2. L.G. Cancado, A. Hartschuh, L. Novotny, J. Raman Spectrosc. 40, 1420 (2009)
3. K.S. Shah, R. Grazioso, R. Farrell, J. Glodo, M. McClish, G. Entine, P. Dokhale, S.R. Cherry, IEEE Trans. Nucl. Sci. 51, 91 (2004)
4. M. Toyoda, K. Araki, Y. Suzuki, Opt. Eng. 41, 145 (2002)
5. L. Zhang, Y. Yang, W. Xia, X. Zhu, W. Chen, Y. Lu, Chin. Opt. Lett. 7, 728 (2009)
6. M.E. Casey, C. Reynolds, D.M. Binkley, J.M. Rochelle, Nucl. Inst. Meth. A 504, 143 (2003)
7. C.M.B. Monteiro, L.M.P. Fernandes, J.A.M. Lopes, J.F.C.A. Veloso, J.M.F. dos Santos, Appl. Phys. B 81, 531 (2005)
8. G. Binnig, C.F. Quate, C. Gerber, Phys. Rev. Lett. 56, 930 (1986)
9. T.E. Schäffer, J.P. Cleveland, F. Ohnesorge, D.A. Walters, P.K. Hansma, J. Appl. Phys. 80, 3622 (1996)
10. M. Reinstaedtler, U. Rabe, V. Scherer, J.A. Turner, W. Arnold, Surf. Sci. 532, 1152 (2003)
11. C. Yang, A. Bossche, P. J. French, K. B. Gavan, H. S. J. van der Zant, H. Sadeghian, J. F. L. Goosen, F. van Keulen, E. W. J. M. van der Drift IEEE Conf. Sensors, 869 (2009)
12. J.P. Cleveland, S. Manne, D. Bocek, P.K. Hansma, Rev. Sci. Instrum. 64, 403 (1993)
13. O. Basarir, S. Bramhavar, G. Basilio-Sanchez, T. Morse, K.L. Ekinci, Opt. Lett. 35, 1792 (2010)
14. R. Berger, Ch. Gerber, J.K. Gimzewski, E. Meyer, H.J. Güntherodt, Appl. Phys. Lett. 69, 40 (1996)
15. J.K. Gimzewski, Ch. Gerber, E. Meyer, R.R. Schlittler, Chem. Phys. Lett. 217, 589 (1994)
16. J. Varesi, J. Lai, T. Perazzo, Z. Shi, A. Majumdar, Appl. Phys. Lett. 71, 306 (1997)
17. J.R. Barnes, R.J. Stephenson, C.N. Woodburn, S.J. O'Shea, M.E. Welland, T. Rayment, J.K. Gimzewski, Ch. Gerber, Rev. Sci. Instrum. 65, 3793 (1994)
18. L.M. Manojlović, Appl. Opt. 50, 3461 (2011)
19. Radiation Monitoring Devices (RMD), 44 Hunt Street, Watertown, MA 02472, USA