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Volumn 101, Issue 24, 2012, Pages

Digging up bulk band dispersion buried under a passivation layer

(8) Kobayashi, Masaki a,b Muneta, Iriya a Schmitt, Thorsten b Patthey, Luc b Ohya, Sinobu a Tanaka, Masaaki a Oshima, Masaharu a Strocov, Vladimir N b

a UNIVERSITY OF TOKYO (Japan)

b PAUL SCHERRER INSTITUTE (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

ANGLE RESOLVED PHOTOEMISSION SPECTROSCOPY; BAND DISPERSIONS; GAAS; GAAS THIN FILMS; PASSIVATION LAYER; PHOTON ENERGY; SOFT X-RAY; UNDERLAYERS; VACUUM ULTRAVIOLETS;

ELECTRONIC STRUCTURE; FILM THICKNESS; GALLIUM ARSENIDE; PHOTOELECTRON SPECTROSCOPY; SEMICONDUCTING GALLIUM; ULTRAVIOLET RADIATION;

DISPERSIONS;

EID: 84871281409 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.4770289 Document Type: Article

Times cited : (37)

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