A high-resolution synchrotron-radiation angle-resolved photoemission spectrometer with in situ oxide thin film growth capability

Review of Scientific Instruments

Volumn 74, Issue 7, 2003, Pages 3406-3412

  Horiba, K ^a   Ohguchi, H ^a   Kumigashira, H ^a   Oshima, M ^a   Ono, K ^b   Nakagawa, N ^a,e   Lippmaa, M ^a   Kawasaki, M ^c,f   Koinuma, H ^d,f  

^a UNIVERSITY OF TOKYO   (Japan)

^b INSTITUTE OF MATERIALS STRUCTURE SCIENCE   (Japan)

^c TOHOKU UNIVERSITY   (Japan)

^d TOKYO INSTITUTE OF TECHNOLOGY   (Japan)

^e LUCENT TECHNOLOGIES   (United States)

^f NATIONAL INSTITUTE FOR MATERIALS SCIENCE   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

FILM GROWTH; MOLECULAR BEAM EPITAXY; PHOTOEMISSION; SPECTROMETERS; SYNCHROTRON RADIATION;

ENERGY RESOLUTION;

THIN FILMS;

EID: 0041766293     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1584093     Document Type: Article

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