Validation of a correction procedure for removing the optical effects from transmission spectra of thin films on substrates

Journal of Applied Physics

Volumn 112, Issue 9, 2012, Pages

  Milosevic, Milan ^a   King, Sean W ^b  

^a MeV Technologies   (United States)

^b INTEL CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ABSORPTION COEFFICIENTS; BASELINE CORRECTION; CORRECTION PROCEDURE; INFRARED TRANSMISSION SPECTRA; INTERFERENCE FRINGE; MODEL MATERIALS; MULTIPLE REFLECTIONS; OPTICAL EFFECTS; POLISHED SUBSTRATES; RELATIVE DEGREES; SIMULATED SPECTRA; STRONG INTERFERENCE; TRANSMISSION SPECTRUMS;

ABSORPTION SPECTROSCOPY; COMPUTER SIMULATION; THIN FILMS;

LIGHT ABSORPTION;

EID: 84870881049     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4764346     Document Type: Article

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