Variability aware cell library optimization for reliable sub-threshold operation

European Solid-State Circuits Conference

Volumn , Issue , 2012, Pages 42-45

  Gemmeke, Tobias ^a   Ashouei, Maryam ^a  

^a HOLST CENTRE   (Netherlands)

Author keywords

Nanometer Technologie; Near threshold design; Standard cell Design; Sub threshold Logic; Ultra Low Power; Variability

Indexed keywords

NANOMETER TECHNOLOGIE; STANDARD CELL DESIGN; SUBTHRESHOLD; ULTRA-LOW POWER; VARIABILITY;

CMOS INTEGRATED CIRCUITS; ELECTRIC BATTERIES; ENERGY EFFICIENCY; FIR FILTERS; OPTIMIZATION; THRESHOLD LOGIC;

DESIGN;

EID: 84870829505     PISSN: 19308833     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ESSCIRC.2012.6341252     Document Type: Conference Paper

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