Interface engineered BaTiO3/SrTiO3 heterostructures with optimized high-frequency dielectric properties

ACS Applied Materials and Interfaces

Volumn 4, Issue 11, 2012, Pages 5761-5765

  Liu, Ming ^a,b   Ma, Chunrui ^b   Collins, Gregory ^b   Liu, Jian ^b   Chen, Chonglin ^b   Dai, Chao ^c   Lin, Yuan ^c   Shui, Li ^a   Xiang, Feng ^a   Wang, Hong ^a   He, Jie ^d   Jiang, Jiechao ^d   Meletis, Efstathios I ^d   Cole, Melanie W ^e  

^a XI'AN JIAOTONG UNIVERSITY   (China)

^b UNIVERSITY OF TEXAS AT SAN ANTONIO   (United States)

^c UNIVERSITY OF ELECTRONIC SCIENCE AND TECHNOLOGY OF CHINA   (China)

^d University of Texas at Arlington   (United States)

^e U S ARMY RESEARCH LABORATORY   (United States)

Author keywords

BaTiO3 SrTiO3; epitaxial behavior; ferroelectric thin films; heretostrctures; microwave dielectric properties

Indexed keywords

AS-GROWN; BATIO; BEST VALUE; DIELECTRIC LOSS TANGENT; DIELECTRIC MEASUREMENTS; DIELECTRIC PERFORMANCE; EPITAXIAL BEHAVIOR; EPITAXIALLY GROWN; HERETOSTRCTURES; HIGH FREQUENCY HF; HIGH-FREQUENCY DIELECTRICS; INTERFACE EFFECT; LAYER THICKNESS; LOSS TANGENT; MGO; MGO SUBSTRATE; MICRO-STRUCTURAL CHARACTERIZATION; MICROWAVE DIELECTRIC PROPERTIES; MULTI-LAYERED STRUCTURE; PERIODIC NUMBER; ROOM TEMPERATURE; SHARP INTERFACE; TUNABLE MICROWAVE;

BARIUM TITANATE; DIELECTRIC DEVICES; DIELECTRIC LOSSES; EPITAXIAL GROWTH; FERROELECTRIC THIN FILMS; OPTIMIZATION; PULSED LASER DEPOSITION; STRONTIUM TITANATES; SUBSTRATES; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION;

INTERFACES (MATERIALS);

BARIUM DERIVATIVE; BARIUM TITANATE; OXIDE; STRONTIUM; STRONTIUM TITANIUM OXIDE; TITANIUM;

ARTICLE; CHEMISTRY; IMPEDANCE; MICROWAVE RADIATION; SURFACE PROPERTY;

BARIUM COMPOUNDS; ELECTRIC IMPEDANCE; MICROWAVES; OXIDES; STRONTIUM; SURFACE PROPERTIES; TITANIUM;

EID: 84870489555     PISSN: 19448244     EISSN: 19448252     Source Type: Journal    
DOI: 10.1021/am301066u     Document Type: Article

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