X-Ray diffraction measurement of the effect of layer thickness on the ferroelectric transition in epitaxial KTaO3/KNbO3 multilayers

Physical Review Letters

Volumn 80, Issue 19, 1998, Pages 4317-4320

  Specht, E D ^a   Christen, H M ^a,b   Norton, D P ^a  

^a OAK RIDGE NATIONAL LABORATORY   (United States)

^b Neocera Inc   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001544823     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.80.4317     Document Type: Article

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