Quantitative fracture strength and plasticity measurements of lithiated silicon nanowires by in situ TEM tensile experiments

ACS Nano

Volumn 6, Issue 11, 2012, Pages 9425-9432

  Kushima, Akihiro ^a   Huang, Jian Yu ^b   Li, Ju ^a  

^a Massachusetts Institute of Technology Cambridge   (United States)

^b SANDIA NATIONAL LABORATORIES   (United States)

Author keywords

apparent strain vs true strain; battery cyclability; bending; constitutive law; ideal strength

Indexed keywords

AB INITIO; ATOMIC FORCE MICROSCOPY CANTILEVERS; AXIAL TENSILE STRENGTH; CONSTITUTIVE LAW; CYCLABILITY; FRACTURE STRAIN; IDEAL STRENGTH; IN-SITU TEM; IN-SITU TENSION; INITIAL VALUES; LITHIATION; LITHIUM-ION BATTERY; SI NANOWIRE; SILICON NANOWIRES; TENSILE PLASTICITY; TRANSMISSION ELECTRON MICROSCOPE; TRUE STRAIN;

ATOMIC FORCE MICROSCOPY; BENDING (FORMING); FRACTURE; LITHIUM ALLOYS; NANOWIRES; PLASTICITY; SCANNING TUNNELING MICROSCOPY; SILICON; TENSILE STRENGTH; TRANSMISSION ELECTRON MICROSCOPY;

SILICON ALLOYS;

ALLOY; LITHIUM; SILICON;

ARTICLE; ATOMIC FORCE MICROSCOPY; CHEMISTRY; HARDNESS; MATERIALS TESTING; METHODOLOGY; TENSILE STRENGTH; TRANSMISSION ELECTRON MICROSCOPY; YOUNG MODULUS;

ALLOYS; ELASTIC MODULUS; HARDNESS; LITHIUM; MATERIALS TESTING; MICROSCOPY, ATOMIC FORCE; MICROSCOPY, ELECTRON, TRANSMISSION; SILICON; TENSILE STRENGTH;

EID: 84870453308     PISSN: 19360851     EISSN: 1936086X     Source Type: Journal    
DOI: 10.1021/nn3037623     Document Type: Article

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