In situ measurements of stress-potential coupling in lithiated silicon

Journal of the Electrochemical Society

Volumn 157, Issue 11, 2010, Pages

  Sethuraman, V A ^a   Srinivasan, V ^b   Bower, A F ^a   Guduru, P R ^a  

^a Brown University   (United States)

^b LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE CAPACITIES; DE-LITHIATION; ELECTROCHEMICAL LITHIATION; EXPERIMENTAL INVESTIGATIONS; IN-SITU; IN-SITU MEASUREMENT; ORDER OF MAGNITUDE; POTENTIAL CHANGE; SILICON ELECTRODE; STATE OF CHARGE; STATE OF STRESS; STRESS CHANGES; THIN-FILM ELECTRODE; THIN-FILM GEOMETRY;

ELECTRIC POTENTIAL;

ELECTROCHEMICAL ELECTRODES;

EID: 77957691070     PISSN: 00134651     EISSN: None     Source Type: Journal    
DOI: 10.1149/1.3489378     Document Type: Article

References (66)

1. M. N. Obrovac and L. Christensen, Electrochem. Solid-State Lett. ESLEF6 1099-0062, 7, A93 (2004). 10.1149/1.1652421
2. J. Li and J. R. Dahn, J. Electrochem. Soc. JESOAN 0013-4651, 154, A156 (2007). 10.1149/1.2409862
3. J. -M. Tarascon and M. Armand, Nature (London) NATUAS 0028-0836, 414, 359 (2001). 10.1038/35104644 (Pubitemid 33100023)
4. V. A. Sethuraman, L. J. Hardwick, V. Srinivasan, and R. Kostecki, J. Power Sources JPSODZ 0378-7753, 195, 3655 (2010). 10.1016/j.jpowsour.2009.12.034
5. U. Kasavajjula, C. Wang, and A. J. Appleby, J. Power Sources JPSODZ 0378-7753, 163, 1003 (2007). 10.1016/j.jpowsour.2006.09.084 (Pubitemid 44959613)
6. C. K. Chan, H. Peng, G. Liu, K. McIlwrath, X. F. Zhang, R. A. Huggins, and Y. Cui, Nat. Nanotechnol. NNAABX 1748-3387, 3, 31 (2008). 10.1038/nnano.2007.411
7. B. Gao, S. Sinha, L. Fleming, and O. Zhou, Adv. Mater. ADVMEW 0935-9648, 13, 816 (2001). 10.1002/1521-4095(200106)13:11<816::AID-ADMA8163.0.CO;2-P
8. K. Peng, J. Jie, W. Zhang, and S. -T. Lee, Appl. Phys. Lett. APPLAB 0003-6951, 93, 033105 (2008). 10.1063/1.2929373
9. M. Green, E. Fielder, B. Scrosati, M. Wachtler, and J. S. Moreno, Electrochem. Solid-State Lett. ESLEF6 1099-0062, 6, A75 (2003). 10.1149/1.1563094
10. S. Bourderau, T. Brousse, and D. M. Schleich, J. Power Sources JPSODZ 0378-7753, 81-82, 233 (1999). 10.1016/S0378-7753(99)00194-9 (Pubitemid 32077814)
11. A. Netz, R. A. Huggins, and W. Weppner, J. Power Sources JPSODZ 0378-7753, 119-121, 95 (2003). 10.1016/S0378-7753(03)00132-0
12. J. P. Maranchi, A. F. Hepp, and P. N. Kumta, Electrochem. Solid-State Lett. ESLEF6 1099-0062, 6, A198 (2003). 10.1149/1.1596918
13. V. Baranchugov, E. Markevich, E. Pollak, G. Salitra, and D. Aurbach, Electrochem. Commun. ECCMF9 1388-2481, 9, 796 (2007). 10.1016/j.elecom.2006.11. 014 (Pubitemid 46507932)
14. P. Limthongkul, Y. -I. Jang, N. J. Dudney, and Y. -M. Chiang, Acta Mater. ACMAFD 1359-6454, 51, 1103 (2003). 10.1016/S1359-6454(02)00514-1
15. B. Bang, M. -H. Kim, H. -S. Moon, Y. -K. Lee, and J. -W. Park, J. Power Sources JPSODZ 0378-7753, 156, 604 (2006). 10.1016/j.jpowsour.2005.05.096 (Pubitemid 44218650)
16. J. Graetz, C. C. Ahn, R. Yazami, and B. Fultz, Electrochem. Solid-State Lett. ESLEF6 1099-0062, 6, A194 (2003). 10.1149/1.1596917
17. M. N. Obrovac and L. J. Krause, J. Electrochem. Soc. JESOAN 0013-4651, 154, A103 (2007). 10.1149/1.2402112 (Pubitemid 46094465)
18. J. H. Ryu, J. W. Kim, Y. -E. Sung, and S. M. Oh, Electrochem. Solid-State Lett. ESLEF6 1099-0062, 7, A306 (2004). 10.1149/1.1792242
19. B. A. Boukamp, G. C. Lesh, and R. A. Huggins, J. Electrochem. Soc. JESOAN 0013-4651, 128, 725 (1981). 10.1149/1.2127495
20. W. -R. Liu, M. -H. Yang, H. -C. Wu, S. M. Chiao, and N. -L. Wu, Electrochem. Solid-State Lett. ESLEF6 1099-0062, 8, A100 (2005). 10.1149/1.1847685 (Pubitemid 40214020)
21. N. Dimov and M. Yoshio, J. Power Sources JPSODZ 0378-7753, 174, 607 (2007). 10.1016/j.jpowsour.2007.06.118 (Pubitemid 350117317)
22. M. N. Obrovac, L. Christensen, D. B. Le, and J. R. Dahn, J. Electrochem. Soc. JESOAN 0013-4651, 154, A849 (2007). 10.1149/1.2752985 (Pubitemid 47186599)
23. L. Y. Beaulieu, K. C. Hewitt, R. L. Turner, A. Bonakdarpour, A. A. Abdo, L. Christensen, K. W. Eberman, L. J. Krause, and J. R. Dahn, J. Electrochem. Soc. JESOAN 0013-4651, 150, A149 (2003). 10.1149/1.1530151
24. C. -H. Doh, N. Kalaiselvi, C. -W. Park, B. S. Jin, S. -I. Moon, and M. -S. Yun, Electrochem. Commun. ECCMF9 1388-2481, 6, 965 (2004). 10.1016/j.elecom.2004.07.011
25. H. Dong, R. X. Feng, X. P. Ai, Y. L. Cao, and H. X. Yang, Electrochim. Acta ELCAAV 0013-4686, 49, 5217 (2004). 10.1016/j.electacta.2004.07.003
26. H. Dong, X. P. Ai, and H. X. Yang, Electrochem. Commun. ECCMF9 1388-2481, 5, 952 (2003). 10.1016/j.elecom.2003.09.004
27. S. -J. Lee, H. -Y. Lee, H. -K. Baik, and S. -M. Lee, J. Power Sources JPSODZ 0378-7753, 119-121, 113 (2003). 10.1016/S0378-7753(03)00137-X
28. M. K. Datta and P. N. Kumta, J. Power Sources JPSODZ 0378-7753, 158, 557 (2006). 10.1016/j.jpowsour.2005.09.016 (Pubitemid 43867996)
29. M. K. Datta and P. N. Kumta, J. Power Sources JPSODZ 0378-7753, 165, 368 (2007). 10.1016/j.jpowsour.2006.12.013 (Pubitemid 46216721)
30. N. Dimov, S. Kugino, and M. Yoshio, Electrochim. Acta ELCAAV 0013-4686, 48, 1579 (2003). 10.1016/S0013-4686(03)00030-6
31. N. Dimov, K. Fukuda, T. Umeno, S. Kugino, and M. Yoshio, J. Power Sources JPSODZ 0378-7753, 114, 88 (2003). 10.1016/S0378-7753(02)00533-5 (Pubitemid 41331216)
32. N. Dimov, S. Kugino, and M. Yoshio, J. Power Sources JPSODZ 0378-7753, 136, 108 (2004). 10.1016/j.jpowsour.2004.05.012
33. T. Hasegawa, S. R. Mukai, Y. Shirato, and H. Tamon, Carbon CRBNAH 0008-6223, 42, 2573 (2004). 10.1016/j.carbon.2004.05.050
34. M. Holzapfel, H. Buqa, W. Scheifele, P. Novák, and F. -M. Petrat, Chem. Commun. (Cambridge) CHCOFS 1359-7345, 2005, 1566.
35. Panasonic's New Li-ion Batteries Use Si Anode for 30% Higher Capacity, Nikkei Electronics Asia, March 2010.
36. K. Yasuda, in Fifth International Symposium on Large Lithium-Ion Battery Technology and Applications (2009).
37. V. Srinivasan, V. A. Sethuraman, and J. Newman, Abstract 607, The Electrochemical Society Meeting Abstracts, Vol. 802, Honolulu, HI, Oct 12-17, 2008.
38. V. Srinivasan, V. Sethuraman, and J. Newman, United States Department of Energy, Office of Vehicle Technologies Annual Merit Review, Bethesda, Maryland, Feb 28, 2008.
39. V. A. Sethuraman, V. Srinivasan, and J. Newman, J. Electrochem. Soc. JESOAN 0013-4651, To be submitted.
40. S. Ohara, J. Suzuki, K. Sekine, and T. Takamura, Electrochemistry (Tokyo, Jpn.) EECTFA 1344-3542, 71, 1126 (2003).
41. W. -R. Liu, Z. -Z. Guo, W. -S. Young, D. -T. Shieh, H. -C. Wu, M. -H. Yang, and N. -L. Wu, J. Power Sources JPSODZ 0378-7753, 140, 139 (2005). 10.1016/j.jpowsour.2004.07.032
42. T. D. Hatchard and J. R. Dahn, J. Electrochem. Soc. JESOAN 0013-4651, 151, A838 (2004). 10.1149/1.1739217
43. V. Srinivasan, J. W. Weidner, and J. Newman, J. Electrochem. Soc. JESOAN 0013-4651, 148, A969 (2001). 10.1149/1.1385846 (Pubitemid 33693675)
44. V. A. Sethuraman, V. Srinivasan, and J. Newman, Abstract 1189, The Electrochemical Society Meeting Abstracts, Vol. 802, Honolulu, HI, Oct 12-17, 2008.
45. L. Baggetto, R. A. H. Niessen, F. Roozeboom, and P. H. L. Notten, Adv. Funct. Mater. AFMDC6 1616-301X, 18, 1057 (2008). 10.1002/adfm.200701245 (Pubitemid 351584781)
46. V. L. Chevrier and J. R. Dahn, J. Electrochem. Soc. JESOAN 0013-4651, 156, A454 (2009). 10.1149/1.3111037
47. J. Christensen and J. Newman, J. Solid State Electrochem. JSSEFS 1432-8488, 10, 293 (2006). 10.1007/s10008-006-0095-1
48. J. Christensen and J. Newman, J. Electrochem. Soc. JESOAN 0013-4651, 153, A1019 (2006). 10.1149/1.2185287
49. V. A. Sethuraman, M. J. Chon, M. Shimshak, V. Srinivasan, and P. R. Guduru, J. Power Sources JPSODZ 0378-7753, 195, 5062 (2010). 10.1016/j.jpowsour.2010.02.013
50. F. Larch́ and J. W. Cahn, Acta Metall. AMETAR 0001-6160, 21, 1051 (1973). 10.1016/0001-6160(73)90021-7
51. F. Larch́ and J. W. Cahn, Acta Metall. AMETAR 0001-6160, 26, 53 (1978). 10.1016/0001-6160(78)90201-8
52. F. C. Larch́ and J. W. Cahn, Acta Metall. AMETAR 0001-6160, 30, 1835 (1982). 10.1016/0001-6160(82)90023-2
53. F. C. Larch́ and J. W. Cahn, Acta Metall. AMETAR 0001-6160, 33, 331 (1985). 10.1016/0001-6160(85)90077-X (Pubitemid 15560394)
54. S. D. Beattie, D. Larcher, M. Morcrette, B. Simon, and J. -M. Tarascon, J. Electrochem. Soc. JESOAN 0013-4651, 155, A158 (2008). 10.1149/1.2817828
55. V. A. Sethuraman, M. J. Chon, M. Shimshak, N. Van Winkle, and P. R. Guduru, Electrochem. Commun. ECCMF9 1388-2481, In press. [DOI: 10.1016/j.elecom.2010.09.008]
56. V. B. Shenoy, P. Johari, and Y. Qi, J. Power Sources JPSODZ 0378-7753, 195, 6825 (2010). 10.1016/j.jpowsour.2010.04.044
57. O. Renner and J. Zemek, Czech. J. Phys. CZLIA6 0011-4626, 23, 1273 (1973). 10.1007/BF01591210
58. J. P. Maranchi, A. F. Hepp, A. G. Evans, N. T. Nuhfer, and P. N. Kumta, J. Electrochem. Soc. JESOAN 0013-4651, 153, A1246 (2006). 10.1149/1.2184753
59. V. A. Sethuraman, K. Kowolik, and V. Srinivasan, J. Power Sources JPSODZ 0378-7753, 196, 393 (2011). 10.1016/j.jpowsour.2010.06.043
60. N. -S. Choi, K. H. Yew, K. Y. Lee, M. Sung, H. Kim, and S. -S. Kim, J. Power Sources JPSODZ 0378-7753, 161, 1254 (2006). 10.1016/j.jpowsour.2006.05.049 (Pubitemid 44738770)
61. G. G. Stoney, Proc. R. Soc. London, Ser. A PRLAAZ 0950-1207, 82, 172 (1909). 10.1098/rspa.1909.0021
62. L. B. Freund and S. Suresh, Thin Film Materials: Stress, Defect Formation, and Surface Evolution, Cambridge University Press, Cambridge, UK (2004). 10.1017/CBO9780511754715
63. W. A. Brantley, J. Appl. Phys. JAPIAU 0021-8979, 44, 534 (1973). 10.1063/1.1661935
64. L. Y. Beaulieu, T. D. Hatchard, A. Bonakdarpour, M. D. Fleischauer, and J. R. Dahn, J. Electrochem. Soc. JESOAN 0013-4651, 150, A1457 (2003). 10.1149/1.1613668
65. L. Y. Beaulieu, V. K. Cumyn, K. W. Eberman, L. J. Krause, and J. R. Dahn, Rev. Sci. Instrum. RSINAK 0034-6748, 72, 3313 (2001). 10.1063/1.1388214
66. N. Ding, J. Xu, Y. X. Yao, G. Wegner, X. Fang, C. H. Chen, and I. Lieberwirth, Solid State Ionics SSIOD3 0167-2738, 180, 222 (2009). 10.1016/j.ssi.2008.12.015