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Volumn 16, Issue 1, 2013, Pages 29-37

Effect of annealing on structural, optical and electrical properties of pulse electrodeposited tin sulfide films

Author keywords

Pulse electrodeposition; Raman spectra; SnS

Indexed keywords

CONDUCTING GLASS; ELECTRIC CONDUCTION; MORPHOLOGICAL CHANGES; OPTICAL AND ELECTRICAL PROPERTIES; OPTOELECTRONIC PROPERTIES; POLYCRYSTALLINE; POST DEPOSITION TREATMENT; PULSE ELECTRODEPOSITION; RAMAN SPECTRAL DATA; SECOND PHASE; SHALLOW TRAPS; SNS; SNS FILMS; TIN SULFIDE; TIN SULFIDE FILMS;

EID: 84870446034     PISSN: 13698001     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.mssp.2012.07.003     Document Type: Article
Times cited : (53)

References (33)
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    • Xuanzhi Wu Solar Energy 77 2004 803 814
    • (2004) Solar Energy , vol.77 , pp. 803-814
    • Wu, X.1
  • 23
    • 84870455543 scopus 로고
    • Crystallographic Methods
    • 3rd ed. McGraw Hill NY p. 205
    • Charles S. Barrett, and T.B. Massalski Crystallographic Methods Principles and Data 3rd ed. 1966 McGraw Hill NY p. 205
    • (1966) Principles and Data
    • Barrett, C.S.1    Massalski, T.B.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.