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Volumn 16, Issue 1, 2013, Pages 29-37
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Effect of annealing on structural, optical and electrical properties of pulse electrodeposited tin sulfide films
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Author keywords
Pulse electrodeposition; Raman spectra; SnS
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Indexed keywords
CONDUCTING GLASS;
ELECTRIC CONDUCTION;
MORPHOLOGICAL CHANGES;
OPTICAL AND ELECTRICAL PROPERTIES;
OPTOELECTRONIC PROPERTIES;
POLYCRYSTALLINE;
POST DEPOSITION TREATMENT;
PULSE ELECTRODEPOSITION;
RAMAN SPECTRAL DATA;
SECOND PHASE;
SHALLOW TRAPS;
SNS;
SNS FILMS;
TIN SULFIDE;
TIN SULFIDE FILMS;
ACTIVATION ENERGY;
ANNEALING;
ELECTRODEPOSITION;
ELECTRONIC PROPERTIES;
GRAIN GROWTH;
MORPHOLOGY;
RAMAN SCATTERING;
SCANNING ELECTRON MICROSCOPY;
SUBSTRATES;
TIN;
X RAY DIFFRACTION ANALYSIS;
ELECTRIC PROPERTIES;
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EID: 84870446034
PISSN: 13698001
EISSN: None
Source Type: Journal
DOI: 10.1016/j.mssp.2012.07.003 Document Type: Article |
Times cited : (53)
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References (33)
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