SCOPUS 정보 검색 플랫폼

Journal of the Electrochemical Society

Volumn 157, Issue 3, 2010, Pages

Tin sulfide thin films by pulse electrodeposition: Structural, morphological, and optical properties

(5) Mathews, N R a Anaya, Hiran B M a Cortes Jacome, M A b Angeles Chavez, C b Toledo Antonio, J A b

a INSTITUTO DE ENERGÍAS RENOVABLES (Mexico)

b INSTITUTO MEXICANO DEL PETRÓLEO (Mexico)

Author keywords

[No Author keywords available]

Indexed keywords

APPLIED POTENTIALS; AVERAGE SIZE; BAND GAPS; DIRECT TRANSITION; ELEMENTAL COMPOSITIONS; ENERGY DISPERSIVE X RAY SPECTROSCOPY; GRAIN SIZE; OPTICAL SPECTRA; ORTHORHOMBIC STRUCTURES; PULSE ELECTRODEPOSITION; RAMAN SPECTRA; SATURATED CALOMEL ELECTRODE; TIN SULFIDE; TRANSMISSION ELECTRON MICROSCOPY IMAGES; TRANSPARENT CONDUCTIVE OXIDES;

AGGLOMERATION; CRYSTALLITES; ELECTRODEPOSITION; OPTICAL FILMS; OPTICAL PROPERTIES; PHOTOVOLTAIC EFFECTS; RAMAN SPECTROSCOPY; SCANNING ELECTRON MICROSCOPY; SURFACE ANALYSIS; THIN FILMS; TIN; TITANIUM COMPOUNDS; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION ANALYSIS; X RAY SPECTROSCOPY; CONDUCTIVE FILMS; ELECTRON MICROSCOPY; ENERGY DISPERSIVE SPECTROSCOPY; OXIDE FILMS; SUBSTRATES; TIN OXIDES;

X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 76349115850 PISSN: 00134651 EISSN: None Source Type: Journal
DOI: 10.1149/1.3289318 Document Type: Article

Times cited : (122)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.